公开(公告)号：US20110273702A1

公开(公告)日：2011-11-10

申请号：US13145194

申请日：2010-01-20

Applicant: Nicholas H. H. Jones ,  Nicholas J. Weston ,  Kevyn B. Jonas ,  Jonathan D. Shephard ,  Duncan P. Hand ,  Mateusz Matysiak

Inventor： Nicholas H. H. Jones ,  Nicholas J. Weston ,  Kevyn B. Jonas ,  Jonathan D. Shephard ,  Duncan P. Hand ,  Mateusz Matysiak

IPC: G01J3/30 ,  G01N21/88 ,  G01N21/27

CPC classification number: G01N21/8806 ,  G01N21/8422 ,  G01N21/95 ,  G01N21/9515

Abstract: A detecting system for detecting flaws in a sample includes an illumination assembly and detecting assembly. The illumination assembly has an infra-red light source and illumination optics for directing a beam of light from the light source to a spot on or within a sample. The detection assembly has a detector for detecting light from an illuminated spot on or within a sample and detection optics for directing light from an illuminated spot on or within a sample to the detector. Such a system may be used for determining flaws in a sample such as a thermal barrier coating on a turbine blade, or a dental or other medical part. In particular the system may be used for determining flaws in a ceramic sample. A method for detecting flaws in a sample is further described.

Abstract translation: 用于检测样本中的缺陷的检测系统包括照明组件和检测组件。 照明组件具有红外光源和照明光学器件，用于将来自光源的光束引导到样品上或样品内的斑点。 检测组件具有检测器，用于检测来自样本上或样品内的照明点的光，以及检测光学器件，用于将来自样品上的照射斑点的光引导到检测器。 这样的系统可用于确定样品中的缺陷，例如涡轮叶片或牙科或其它医疗部件上的热障涂层。 特别地，该系统可用于确定陶瓷样品中的缺陷。 进一步描述用于检测样品中的缺陷的方法。