公开(公告)号：US07990536B2

公开(公告)日：2011-08-02

申请号：US12536292

申请日：2009-08-05

申请人： Kwan Heng Lee ,  Duck Bong Kim ,  Kang Su Park ,  Kang Yeon Kim ,  Myoung Kook Seo

发明人： Kwan Heng Lee ,  Duck Bong Kim ,  Kang Su Park ,  Kang Yeon Kim ,  Myoung Kook Seo

IPC分类号： G01J3/52

CPC分类号： G01N21/55

摘要： There are disclosed a system and a method for measuring reflectance of an object. The system for measuring reflectance of an object according to the present invention includes: a light source unit including a light source irradiating light to the object; a light source position adjusting unit that adjusts a position and a direction of the light source unit; a light receiving unit that acquires image data by detecting light reflected on the object; and a reflectance acquiring unit that acquires the reflectance of the object from the image data. According to the present invention, it is possible to more precisely acquire the reflectance of the object within a shorter time.

摘要翻译： 公开了一种用于测量物体的反射率的系统和方法。 根据本发明的用于测量物体的反射率的系统包括：光源单元，包括向所述物体照射光的光源; 光源位置调整单元，调整光源单元的位置和方向; 光接收单元，通过检测在物体上反射的光来获取图像数据; 以及反射率获取单元，其根据图像数据获取对象的反射率。 根据本发明，可以在更短的时间内更准确地获得物体的反射率。

公开(公告)号：US20100033721A1

公开(公告)日：2010-02-11

申请号：US12536292

申请日：2009-08-05

申请人： Kwan Heng LEE ,  Duck Bong KIM ,  Kang Su PARK ,  Kang Yeon KIM ,  Myoung Kook SEO

发明人： Kwan Heng LEE ,  Duck Bong KIM ,  Kang Su PARK ,  Kang Yeon KIM ,  Myoung Kook SEO

IPC分类号： G01N21/55 ,  G01J3/52

CPC分类号： G01N21/55

摘要： There are disclosed a system and a method for measuring reflectance of an object. The system for measuring reflectance of an object according to the present invention includes: a light source unit including a light source irradiating light to the object; a light source position adjusting unit that adjusts a position and a direction of the light source unit; a light receiving unit that acquires image data by detecting light reflected on the object; and a reflectance acquiring unit that acquires the reflectance of the object from the image data. According to the present invention, it is possible to more precisely acquire the reflectance of the object within a shorter time.

摘要翻译： 公开了一种用于测量物体的反射率的系统和方法。 根据本发明的用于测量物体的反射率的系统包括：光源单元，包括向所述物体照射光的光源; 光源位置调整单元，调整光源单元的位置和方向; 光接收单元，通过检测在物体上反射的光来获取图像数据; 以及反射率获取单元，其根据图像数据获取对象的反射率。 根据本发明，可以在更短的时间内更准确地获得物体的反射率。