公开(公告)号：US20080013071A1

公开(公告)日：2008-01-17

申请号：US11666078

申请日：2005-11-01

申请人： Naoki Tsumura ,  Kazushiro Fukushima

发明人： Naoki Tsumura ,  Kazushiro Fukushima

IPC分类号： G01J3/00

CPC分类号： G01N21/3581

摘要： A measuring equipment utilizing terahertz pulse light, includes: a terahertz light generator that generates terahertz pulse light; a terahertz light detector that detects terahertz pulse light; a first condensing optical system that condenses the terahertz pulse light generated by the terahertz light generator; and a second condensing optical system that condenses the terahertz pulse light diverging after being condensed by the first condensing optical system, onto the terahertz light detector. A sample is arranged in a vicinity of a position of condensing the terahertz pulse light by the first condensing optical system; and at least one of the first and the second condensing optical systems includes at least one optical device having a positive or negative refractive power. The measuring equipment further includes: a position adjusting mechanism that adjusts a position of the at least one optical device on an optical axis when the terahertz light detector detects the terahertz pulse light having transmitted through the sample; and a controlling unit that controls the position adjusting mechanism.

摘要翻译： 利用太赫兹脉冲光的测量设备包括：产生太赫兹脉冲光的太赫兹光发生器; 检测太赫兹脉冲光的太赫兹光检测器; 第一聚光光学系统，其冷凝由太赫兹光发生器产生的太赫脉冲光; 以及第二聚光光学系统，其将由第一聚光光学系统聚集后的太赫兹脉冲光发散到太赫兹光检测器上。 将样品配置在通过第一聚光光学系统凝结太赫兹脉冲光的位置附近; 并且第一和第二聚光光学系统中的至少一个包括具有正或负折射光焦度的至少一个光学器件。 测量设备还包括：位置调节机构，当太赫兹光检测器检测到穿过样本的太赫兹脉冲光时，调节至少一个光学器件在光轴上的位置; 以及控制单元，其控制位置调整机构。

公开(公告)号：US07847931B2

公开(公告)日：2010-12-07

申请号：US11666078

申请日：2005-11-01

申请人： Naoki Tsumura ,  Kazushiro Fukushima

发明人： Naoki Tsumura ,  Kazushiro Fukushima

IPC分类号： G01J3/00

CPC分类号： G01N21/3581

摘要： A measuring equipment utilizing terahertz pulse light, includes: a terahertz light generator that generates terahertz pulse light; a terahertz light detector that detects terahertz pulse light; a first condensing optical system that condenses the terahertz pulse light generated by the terahertz light generator; and a second condensing optical system that condenses the terahertz pulse light diverging after being condensed by the first condensing optical system, onto the terahertz light detector. A sample is arranged in a vicinity of a position of condensing the terahertz pulse light by the first condensing optical system; and at least one of the first and the second condensing optical systems includes at least one optical device having a positive or negative refractive power. The measuring equipment further includes: a position adjusting mechanism that adjusts a position of the at least one optical device on an optical axis when the terahertz light detector detects the terahertz pulse light having transmitted through the sample; and a controlling unit that controls the position adjusting mechanism.

摘要翻译： 利用太赫兹脉冲光的测量设备包括：产生太赫兹脉冲光的太赫兹光发生器; 检测太赫兹脉冲光的太赫兹光检测器; 第一聚光光学系统，其冷凝由太赫兹光发生器产生的太赫脉冲光; 以及第二聚光光学系统，其将由第一聚光光学系统聚集后的太赫兹脉冲光发散到太赫兹光检测器上。 将样品配置在通过第一聚光光学系统凝结太赫兹脉冲光的位置附近; 并且第一和第二聚光光学系统中的至少一个包括具有正或负折射光焦度的至少一个光学器件。 测量设备还包括：位置调节机构，当太赫兹光检测器检测到穿过样本的太赫兹脉冲光时，调节至少一个光学器件在光轴上的位置; 以及控制单元，其控制位置调整机构。