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    Near-field optical microscope, near-field optical probe, and sample observation method
    5.
    发明授权
    Near-field optical microscope, near-field optical probe, and sample observation method 失效
    近场光学显微镜，近场光学探针和样品观察法

    公开(公告)号：US08424111B2

    公开(公告)日：2013-04-16

    申请号：US13167172

    申请日：2011-06-23

    申请人： Koichi Karaki ,  Kimihiko Nishioka ,  Yasuo Sasaki ,  Takuya Tsukagoshi ,  Yoshiharu Ajiki ,  Isao Shimoyama ,  Kiyoshi Matsumoto ,  Tetsuro Kan ,  Yusuke Takei ,  Kentaro Noda

    发明人： Koichi Karaki ,  Kimihiko Nishioka ,  Yasuo Sasaki ,  Takuya Tsukagoshi ,  Yoshiharu Ajiki ,  Isao Shimoyama ,  Kiyoshi Matsumoto ,  Tetsuro Kan ,  Yusuke Takei ,  Kentaro Noda

    IPC分类号： G01Q60/22

    CPC分类号： G01Q60/22

    摘要： Provided is a scanning near-field optical microscope capable of obtaining, in a highly sensitive manner, optical information having a spatial frequency higher than a spatial frequency corresponding to a wavelength of irradiation light. A scanning near-field optical microscope 100 according to the present invention includes: a light irradiating part 102 for emitting illumination light toward a sample 107; a light receiving part 112 for receiving light; a microstructure for generating or selectively transmitting near-field light, the microstructure being disposed on at least one of an emission side of the light irradiating part 102 and an incident side of the light receiving part 112; and an ultrahigh-wavenumber transmitting medium 108 for transmitting near-field light, the ultrahigh-wavenumber transmitting medium exhibiting anisotropy in permittivity or permeability.

    摘要翻译： 本发明提供能够以高灵敏度的方式获得空间频率高于与照射光的波长相对应的空间频率的光学信息的扫描型近场光学显微镜。 根据本发明的扫描近场光学显微镜100包括：朝向样品107发射照明光的光照射部分102; 用于接收光的光接收部分112; 用于产生或选择性地透射近场光的微结构，所述微结构布置在所述光照射部分102的发射侧和所述光接收部分112的入射侧中的至少一个上; 以及用于发射近场光的超高波数传输介质108，超高波数传输介质具有介电常数或磁导率的各向异性。

    NEAR-FIELD OPTICAL MICROSCOPE, NEAR-FIELD OPTICAL PROBE, AND SAMPLE OBSERVATION METHOD
    7.
    发明申请
    NEAR-FIELD OPTICAL MICROSCOPE, NEAR-FIELD OPTICAL PROBE, AND SAMPLE OBSERVATION METHOD 失效
    近场光学显微镜，近场光学探头和样品观测方法

    公开(公告)号：US20110321204A1

    公开(公告)日：2011-12-29

    申请号：US13167172

    申请日：2011-06-23

    申请人： Koichi KARAKI ,  Kimihiko NISHIOKA ,  Yasuo SASAKI ,  Takuya TSUKAGOSHI ,  Yoshiharu AJIKI ,  Isao SHIMOYAMA ,  Kiyoshi MATSUMOTO ,  Tetsuro KAN ,  Yusuke TAKEI ,  Kentaro NODA

    发明人： Koichi KARAKI ,  Kimihiko NISHIOKA ,  Yasuo SASAKI ,  Takuya TSUKAGOSHI ,  Yoshiharu AJIKI ,  Isao SHIMOYAMA ,  Kiyoshi MATSUMOTO ,  Tetsuro KAN ,  Yusuke TAKEI ,  Kentaro NODA

    IPC分类号： G01Q60/22 ,  G02B21/06 ,  G01Q60/18 ,  H01J3/14

    CPC分类号： G01Q60/22

    摘要： Provided is a scanning near-field optical microscope capable of obtaining in a highly sensitive manner, optical information having a spatial frequency higher than a spatial frequency corresponding to a wavelength of irradiation light. A scanning near-field optical microscope 100 according to the present invention includes: a light irradiating part 102 for emitting illumination light toward a sample 107; a light receiving part 112 for receiving light; a microstructure for generating or selectively transmitting near-field light, the microstructure being disposed on at least one of an emission side of the light irradiating part 102 and an incident side of the light receiving part 112; and an ultrahigh-wavenumber transmitting medium 108 for transmitting near-field light, the ultrahigh-wavenumber transmitting medium exhibiting anisotropy in permittivity or permeability.

    摘要翻译： 提供了能够以高灵敏度的方式获得空间频率高于与照射光的波长相对应的空间频率的光学信息的扫描近场光学显微镜。 根据本发明的扫描近场光学显微镜100包括：朝向样品107发射照明光的光照射部分102; 用于接收光的光接收部分112; 用于产生或选择性地透射近场光的微结构，所述微结构布置在所述光照射部分102的发射侧和所述光接收部分112的入射侧中的至少一个上; 以及用于发射近场光的超高波数传输介质108，超高波数传输介质具有介电常数或磁导率的各向异性。