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1.发明授权公开(公告)号：US11047932B2
公开(公告)日：2021-06-29
申请号：US16819009
申请日：2020-03-13
申请人： Lucas Chen
发明人： Lucas Chen
摘要： An apparatus determines the composition of a metal artifact. The apparatus includes an electrical current source, a metal artifact to be tested, two electrical cables, and a first electrical cable and a second electrical cable different from the first electrical cable. Each of the first electrical cable and the second electrical cable is connected between the electrical current source and the metal artifact. During a test, the electrical current source outputs current. When the electrical current source outputs the current, the current travel through at least a portion of the metal artifact. The apparatus further includes a magnetic field sensor that detects, during the test, a magnetic field generated by the metal artifact when the current travels through the at least the portion of the metal artifact. The magnetic field sensor is disposed within a predetermined distance of the metal artifact during the test.
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2.发明申请公开(公告)号：US20200217905A1
公开(公告)日：2020-07-09
申请号：US16819009
申请日：2020-03-13
申请人： Lucas Chen
发明人： Lucas Chen
摘要： An apparatus determines the composition of a metal artifact. The apparatus includes an electrical current source, a metal artifact to be tested, two electrical cables, and a first electrical cable and a second electrical cable different from the first electrical cable. Each of the first electrical cable and the second electrical cable is connected between the electrical current source and the metal artifact. During a test, the electrical current source outputs current. When the electrical current source outputs the current, the current travel through at least a portion of the metal artifact. The apparatus further includes a magnetic field sensor that detects, during the test, a magnetic field generated by the metal artifact when the current travels through the at least the portion of the metal artifact. The magnetic field sensor is disposed within a predetermined distance of the metal artifact during the test.
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公开(公告)号：US20190275400A1
公开(公告)日：2019-09-12
申请号：US16422731
申请日：2019-05-24
申请人： Lucas CHEN
发明人： Lucas CHEN
摘要： An apparatus may determine the quality of a fencing blade. The apparatus may include an electrical current source; a fencing blade to be tested for quality; two electrical cables, each connected between the electrical current source and the fencing blade so as to cause current from the current source to travel through at least a portion of the fencing blade; and a magnetic field sensor in sufficient proximity to the fencing blade so as to enable the magnetic field sensor to detect a magnetic field generated by the fencing blade when the current passes through the fencing blade.
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公开(公告)号：US11577140B2
公开(公告)日：2023-02-14
申请号：US16422731
申请日：2019-05-24
申请人： Lucas Chen
发明人： Lucas Chen
摘要： An apparatus may determine the quality of a fencing blade. The apparatus may include an electrical current source; a fencing blade to be tested for quality; two electrical cables, each connected between the electrical current source and the fencing blade so as to cause current from the current source to travel through at least a portion of the fencing blade; and a magnetic field sensor in sufficient proximity to the fencing blade so as to enable the magnetic field sensor to detect a magnetic field generated by the fencing blade when the current passes through the fencing blade.
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