公开(公告)号：US20160231318A1

公开(公告)日：2016-08-11

申请号：US15015519

申请日：2016-02-04

Applicant: AISIN SEIKI KABUSHIKI KAISHA ,  Mag Array, Inc. ,  IMRA AMERICA, INC.

Inventor： Koji TOYOMARU

IPC: G01N33/543

CPC classification number: G01N33/54386 ,  G01N27/745

Abstract: A specimen testing package includes a sensor chip provided in its front face with a fixing region of a reactant selectively reacting with a specimen contained in a specimen solution, a substrate to which a back face of the sensor chip is fixed, an external connection lead electrically connected to the sensor chip via a wire, an insulator provided in the substrate for insulating the wire from the outside, and a surrounding wall surrounding the fixing region in form of a continuous loop.

Abstract translation: 样本测试包包括：传感器芯片，其前表面设置有选择性地与包含在样本溶液中的样本反应的反应物的固定区域，传感器芯片的背面固定到的基板，电连接的外部连接引线 通过导线连接到传感器芯片，设置在基板中的用于使线材与外部绝缘的绝缘体和围绕固定区域的连续环形的围绕壁。

公开(公告)号：US20150185213A1

公开(公告)日：2015-07-02

申请号：US14142187

申请日：2013-12-27

Applicant: Mag Array, Inc. ,  Aisin Seiki Kabushiki Kaisha

Inventor： Masayoshi MOMIYAMA ,  Heng Yu

IPC: G01N33/53

CPC classification number: G01N33/5306 ,  G01N33/54393

Abstract: The present invention relates to a method of internal correction in one chip assay, and to a method for measuring a test substance using the method of internal correction. Specifically, an assay system for measuring a test substance and an assay system for measuring an internal standard substance on a single chip are implemented to thereby internally correct measurement values of a test substance. Normalizing measurement values of a test substance using this internal correction quantifies the test substance.

Abstract translation: 本发明涉及一种芯片测定中的内部校正方法以及使用内部校正方法测量测试物质的方法。 具体地，实施用于测量单个芯片上的测试物质的测定系统和用于测量内标物质的测定系统，从而内部校正测试物质的测量值。 使用该内部校正来归一化测试物质的测量值量化测试物质。