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    Semiconductor device analyzer, method for analyzing/manufacturing semiconductor device, and storage medium storing program for analyzing semiconductor device
    2.
    发明授权
    Semiconductor device analyzer, method for analyzing/manufacturing semiconductor device, and storage medium storing program for analyzing semiconductor device 失效
    半导体装置分析装置，半导体装置的分析制造方法以及半导体装置的分析用储存程序

    公开(公告)号：US07016820B2

    公开(公告)日：2006-03-21

    申请号：US09816099

    申请日：2001-03-26

    申请人： Tomohisa Kimura ,  Makiko Okumura

    发明人： Tomohisa Kimura ,  Makiko Okumura

    IPC分类号： G06F17/10 ,  G06F17/50

    CPC分类号： G06F17/5036

    摘要： A semiconductor device analyzer has a substrate model reading module, a Y-matrix entry module, a discriminating module, a matrix reduction module, and an output format discriminating module. The substrate model reading module reads a substrate network model of three-dimensional meshes representing the substrate of a semiconductor device. The substrate network model is a network of resistive and capacitive elements and is used for the simulation and analysis of the semiconductor substrate. The Y-matrix entry module prepares a Y-matrix from the substrate network model, each element of the Y-matrix being expressed with a polynomial of differential operator “s”. The discriminating module discriminates internal nodes to be eliminated from external nodes to be left among the nodes of the substrate network model. The matrix reduction module eliminates the internal nodes, thereby reducing the Y-matrix. The output format determining module determines an output format for an operation result.

    摘要翻译： 半导体器件分析器具有衬底模型读取模块，Y矩阵输入模块，鉴别模块，矩阵简化模块和输出格式识别模块。 衬底模型读取模块读取表示半导体器件的衬底的三维网格的衬底网络模型。 衬底网络模型是电阻和电容元件的网络，用于半导体衬底的仿真和分析。 Y矩阵入口模块从衬底网络模型准备Y矩阵，Y矩阵的每个元素用微分算子“s”的多项式表示。 识别模块将内部节点区别于要从衬底网络模型的节点中留下的外部节点消除。 矩阵减少模块消除了内部节点，从而减少了Y矩阵。 输出格式确定模块确定运算结果的输出格式。

    Noise analyzing apparatus for analyzing noise of autonomous system by simulation
    6.
    发明授权
    Noise analyzing apparatus for analyzing noise of autonomous system by simulation 失效
    通过仿真分析自主系统噪声的噪声分析装置

    公开(公告)号：US5943637A

    公开(公告)日：1999-08-24

    申请号：US773129

    申请日：1996-12-26

    申请人： Makiko Okumura ,  Hiroshi Tanimoto

    发明人： Makiko Okumura ,  Hiroshi Tanimoto

    IPC分类号： G06F17/50 ,  G06F9/06

    CPC分类号： G06F17/5036

    摘要： A noise analyzing apparatus includes an input unit for inputting a structure of an autonomous system, parameter values and analysis conditions, a periodic steady-state solution calculating unit for calculating a periodic steady-state solution of the autonomous system, a noise source adding unit for adding a noise source to a periodic linear time-variant system obtained by linearizing the autonomous system around the periodic steady-state solution, a time-variant transfer function calculating unit for calculating, for each noise source, a time-variant transfer function of the periodic linear time-variant system to which noise sources are added, a reflected component calculating unit for adding power of a time-variant transfer function reflected to a frequency to be observed, and an output unit for outputting as a result of analysis relating to noise based on results of calculations by the above-described calculating units.

    摘要翻译： 一种噪声分析装置，包括输入自动系统的结构的输入单元，参数值和分析条件，用于计算自主系统的周期性稳态解的周期性稳态解决计算单元，噪声源加法单元， 将周期性线性时变系统的周期性线性时变系统加到周期性的稳态解周围的自动系统中，对每个噪声源计算每个噪声源的时变传递函数的时变传递函数计算单元， 添加噪声源的周期性线性时变系统，用于将反映到待观察频率的时变传递函数的功率相加的反射分量计算单元，以及作为噪声分析结果输出的输出单元 基于上述计算单元的计算结果。