公开(公告)号：US07551769B2

公开(公告)日：2009-06-23

申请号：US11524927

申请日：2006-09-21

申请人： Marian Enachescu ,  Sergey Belikov

发明人： Marian Enachescu ,  Sergey Belikov

IPC分类号： G06K9/00 ,  H04N7/18 ,  G01N21/88

CPC分类号： G06T7/001 ,  G06T2207/30141 ,  G06T2207/30148 ,  G09G3/006

摘要： Described are methods and systems for providing improved defect detection and analysis using infrared thermography. Test vectors heat features of a device under test to produce thermal characteristics useful in identifying defects. The test vectors are timed to enhance the thermal contrast between defects and the surrounding features, enabling IR imaging equipment to acquire improved thermographic images. In some embodiments, a combination of AC and DC test vectors maximize power transfer to expedite heating, and therefore testing. Mathematical transformations applied to the improved images further enhance defect detection and analysis. Some defects produce image artifacts, or “defect artifacts,” that obscure the defects, rendering difficult the task of defect location. Some embodiments employ defect-location algorithms that analyze defect artifacts to precisely locate corresponding defects.

摘要翻译： 描述了使用红外热像仪提供改进的缺陷检测和分析的方法和系统。 测试载体对待测器件的热特征产生用于识别缺陷的热特性。 测试矢量定时以增强缺陷和周围特征之间的热对比度，使IR成像设备能够获得改进的热成像图像。 在一些实施例中，AC和DC测试矢量的组合使功率传递最大化，以加速加热，并因此测试。 应用于改进图像的数学变换进一步增强了缺陷检测和分析。 一些缺陷会产生图像伪像或“缺陷伪像”，这样会掩盖缺陷，使缺陷位置的任务变得困难重重。 一些实施例采用分析缺陷伪像的缺陷位置算法来精确地定位相应的缺陷。

公开(公告)号：US07149343B2

公开(公告)日：2006-12-12

申请号：US10370206

申请日：2003-02-18

申请人： Marian Enachescu ,  Sergey Belikov

发明人： Marian Enachescu ,  Sergey Belikov

IPC分类号： G06K9/00 ,  H04N7/18 ,  G01N21/88

CPC分类号： G01R31/308

摘要： Described are methods and systems for providing improved defect detection and analysis using infrared thermography. Test vectors heat features of a device under test to produce thermal characteristics useful in identifying defects. The test vectors are timed to enhance the thermal contrast between defects and the surrounding features, enabling IR imaging equipment to acquire improved thermographic images. In some embodiments, a combination of AC and DC test vectors maximize power transfer to expedite heating, and therefore testing. Mathematical transformations applied to the improved images further enhance defect detection and analysis. Some defects produce image artifacts, or “defect artifacts,” that obscure the defects, rendering difficult the task of defect location. Some embodiments employ defect-location algorithms that analyze defect artifacts to precisely locate corresponding defects.

公开(公告)号：US07538815B1

公开(公告)日：2009-05-26

申请号：US10350130

申请日：2003-01-23

申请人： Sergey Belikov ,  Marian Enachescu

发明人： Sergey Belikov ,  Marian Enachescu

IPC分类号： H04N5/232

CPC分类号： H04N5/23212 ,  G02B7/36

摘要： Described are autofocusing algorithms and system implementations for machine inspection applications. The disclosed algorithms depend neither on the type of image (visual, infrared, spectrometric, scanning, etc.) nor on the type of image detector. Disclosed image filtering techniques, image focus measure functions and adaptive velocity control methods can be used in computer-based inspection systems for many different types of cameras and detectors as well as for a variety of magnification levels. The proposed autofocusing system can utilize the existing imaging hardware of the inspection system and does not require any additional components.

摘要翻译： 描述了机器检测应用的自动对焦算法和系统实现。 所公开的算法既不依赖于图像的类型（视觉，红外，光谱，扫描等）也不依赖于图像检测器的类型。 公开的图像滤波技术，图像聚焦测量功能和自适应速度控制方法可用于许多不同类型的相机和检测器以及各种放大级别的基于计算机的检测系统。 所提出的自动对焦系统可以利用检测系统的现有成像硬件，并且不需要任何附加组件。

公开(公告)号：US20070036420A1

公开(公告)日：2007-02-15

申请号：US11524927

申请日：2006-09-21

申请人： Marian Enachescu ,  Sergey Belikov

发明人： Marian Enachescu ,  Sergey Belikov

IPC分类号： G06K9/00

CPC分类号： G06T7/001 ,  G06T2207/30141 ,  G06T2207/30148 ,  G09G3/006

摘要： Described are methods and systems for providing improved defect detection and analysis using infrared thermography. Test vectors heat features of a device under test to produce thermal characteristics useful in identifying defects. The test vectors are timed to enhance the thermal contrast between defects and the surrounding features, enabling IR imaging equipment to acquire improved thermographic images. In some embodiments, a combination of AC and DC test vectors maximize power transfer to expedite heating, and therefore testing. Mathematical transformations applied to the improved images further enhance defect detection and analysis. Some defects produce image artifacts, or “defect artifacts,” that obscure the defects, rendering difficult the task of defect location. Some embodiments employ defect-location algorithms that analyze defect artifacts to precisely locate corresponding defects.

摘要翻译： 描述了使用红外热像仪提供改进的缺陷检测和分析的方法和系统。 测试载体对待测器件的热特征产生用于识别缺陷的热特性。 测试矢量定时以增强缺陷和周围特征之间的热对比度，使IR成像设备能够获得改进的热成像图像。 在一些实施例中，AC和DC测试矢量的组合使功率传递最大化，以加速加热，并因此测试。 应用于改进图像的数学变换进一步增强了缺陷检测和分析。 一些缺陷会产生图像伪像或“缺陷伪像”，这样会掩盖缺陷，使缺陷位置的任务变得困难重重。 一些实施例采用分析缺陷伪像的缺陷位置算法来精确地定位相应的缺陷。

公开(公告)号：US06840666B2

公开(公告)日：2005-01-11

申请号：US10348940

申请日：2003-01-22

申请人： Marian Enachescu ,  Sergey Belikov

发明人： Marian Enachescu ,  Sergey Belikov

IPC分类号： G01R31/308 ,  G01N25/72 ,  G01R31/02 ,  G01R31/3183

CPC分类号： G01R31/308

摘要： Described are methods and systems for providing improved defect detection and analysis using infrared thermography. Test vectors heat features of a device under test to produce thermal characteristics useful in identifying defects. The test vectors are timed to enhance the thermal contrast between defects and the surrounding features, enabling IR imaging equipment to acquire improved thermographic images. In some embodiments, a combination of AC and DC test vectors maximize power transfer to expedite heating, and therefore testing. Mathematical transformations applied to the improved images further enhance defect detection and analysis. Some defects produce image artifacts, or “defect artifacts,” that obscure the defects, rendering difficult the task of defect location. Some embodiments employ defect-location algorithms that analyze defect artifacts to precisely locate corresponding defects.

摘要翻译： 描述了使用红外热像仪提供改进的缺陷检测和分析的方法和系统。 测试载体对待测器件的热特征产生用于识别缺陷的热特性。 测试矢量定时以增强缺陷和周围特征之间的热对比度，使IR成像设备能够获得改进的热成像图像。 在一些实施例中，AC和DC测试矢量的组合使功率传递最大化，以加速加热，并因此测试。 应用于改进图像的数学变换进一步增强了缺陷检测和分析。 一些缺陷会产生图像伪像或“缺陷伪像”，这样会掩盖缺陷，使缺陷位置的任务变得困难重重。 一些实施例采用分析缺陷伪像的缺陷位置算法来精确地定位相应的缺陷。