公开(公告)号：US08330105B2

公开(公告)日：2012-12-11

申请号：US13274066

申请日：2011-10-14

申请人： Gerd Benner ,  Marko Matijevic

发明人： Gerd Benner ,  Marko Matijevic

IPC分类号： G21K7/00

CPC分类号： H01J37/26 ,  G01N23/04 ,  H01J37/04 ,  H01J2237/0492 ,  H01J2237/2614

摘要： A phase contrast electron microscope has an objective with a back focal plane, a first diffraction lens, which images the back focal plane of the objective magnified into a diffraction intermediate image plane, a second diffraction lens whose principal plane is mounted in the proximity of the diffraction intermediate image plane and a phase-shifting element which is mounted in or in the proximity of the diffraction intermediate image plane. Also, a phase contrast electron microscope has an objective having a back focal plane, a first diffraction lens, a first phase-shifting element and a second phase-shifting element which is mounted in or in the proximity of the diffraction intermediate image plane. The first diffraction lens images the back focal plane of the objective magnified into a diffraction intermediate image plane and the first phase-shifting element is mounted in the back focal plane of the objective.

摘要翻译： 相位对比电子显微镜具有后焦面的目的，第一衍射透镜，其将物镜的后焦平面成像成衍射中间像平面，第二衍射透镜的主平面安装在 衍射中间像平面和安装在衍射中间像平面附近的相移元件。 此外，相位对比电子显微镜具有安装在衍射中间像平面附近或附近的具有后焦平面，第一衍射透镜，第一相移元件和第二相移元件的物镜。 第一衍射透镜将物镜的后焦平面成像成放大为衍射中间像平面，第一相移元件安装在物镜的后焦平面上。

公开(公告)号：US20100181481A1

公开(公告)日：2010-07-22

申请号：US12659751

申请日：2010-03-19

申请人： Gerd Benner ,  Marko Matijevic

发明人： Gerd Benner ,  Marko Matijevic

IPC分类号： H01J37/26 ,  H01J37/22

CPC分类号： H01J37/26 ,  G01N23/04 ,  H01J37/04 ,  H01J2237/0492 ,  H01J2237/2614

摘要： A phase contrast electron microscope has an objective (8) with a back focal plane (10), a first diffraction lens (11), which images the back focal plane (10) of the objective (8) magnified into a diffraction intermediate image plane, a second diffraction lens (15) whose principal plane is mounted in the proximity of the diffraction intermediate image plane and a phase-shifting element (16) which is mounted in or in the proximity of the diffraction intermediate image plane. Also, a phase contrast electron microscope has an objective (8) having a back focal plane (10), a first diffraction lens (11), a first phase-shifting element and a second phase-shifting element which is mounted in or in the proximity of the diffraction intermediate image plane. The first diffraction lens (11) images the back focal plane of the objective magnified into a diffraction intermediate image plane and the first phase-shifting element is mounted in the back focal plane (10) of the objective (8). With the magnified imaging of the diffraction plane by the diffraction lens, the dimensional requirements imposed on the phase plate having the phase-shifting element are reduced.

摘要翻译： 相差电子显微镜具有物镜（8），具有后焦平面（10），第一衍射透镜（11），其将物镜（8）的后焦平面（10）成像放大到衍射中间像平面 ，其主平面安装在衍射中间像平面附近的第二衍射透镜（15）和安装在衍射中间像平面附近或附近的相移元件（16）。 此外，相位对比电子显微镜具有物镜（8），其具有后焦平面（10），第一衍射透镜（11），第一相移元件和第二相移元件，其安装在或 接近衍射中间像平面。 第一衍射透镜（11）将放大的物镜的后焦平面成像为衍射中间像平面，第一相移元件安装在物镜（8）的后焦平面（10）中。 通过衍射透镜对衍射平面的放大成像，施加在具有相移元件的相位板上的尺寸要求减小。

公开(公告)号：US20120049062A1

公开(公告)日：2012-03-01

申请号：US13274066

申请日：2011-10-14

申请人： Gerd Benner ,  Marko Matijevic

发明人： Gerd Benner ,  Marko Matijevic

IPC分类号： H01J37/28

CPC分类号： H01J37/26 ,  G01N23/04 ,  H01J37/04 ,  H01J2237/0492 ,  H01J2237/2614

摘要： A phase contrast electron microscope has an objective with a back focal plane, a first diffraction lens, which images the back focal plane of the objective magnified into a diffraction intermediate image plane, a second diffraction lens whose principal plane is mounted in the proximity of the diffraction intermediate image plane and a phase-shifting element which is mounted in or in the proximity of the diffraction intermediate image plane. Also, a phase contrast electron microscope has an objective having a back focal plane, a first diffraction lens, a first phase-shifting element and a second phase-shifting element which is mounted in or in the proximity of the diffraction intermediate image plane. The first diffraction lens images the back focal plane of the objective magnified into a diffraction intermediate image plane and the first phase-shifting element is mounted in the back focal plane of the objective.

摘要翻译： 相位对比电子显微镜具有后焦面的目的，第一衍射透镜，其将物镜的后焦平面成像成衍射中间像平面，第二衍射透镜的主平面安装在 衍射中间像平面和安装在衍射中间像平面附近的相移元件。 此外，相位对比电子显微镜具有安装在衍射中间像平面附近或附近的具有后焦平面，第一衍射透镜，第一相移元件和第二相移元件的物镜。 第一衍射透镜将物镜的后焦平面成像成放大为衍射中间像平面，第一相移元件安装在物镜的后焦平面上。

公开(公告)号：US08039796B2

公开(公告)日：2011-10-18

申请号：US12659751

申请日：2010-03-19

申请人： Gerd Benner ,  Marko Matijevic

发明人： Gerd Benner ,  Marko Matijevic

IPC分类号： G21K7/00

CPC分类号： H01J37/26 ,  G01N23/04 ,  H01J37/04 ,  H01J2237/0492 ,  H01J2237/2614

摘要： A phase contrast electron microscope has an objective (8) with a back focal plane (10), a first diffraction lens (11), which images the back focal plane (10) of the objective (8) magnified into a diffraction intermediate image plane, a second diffraction lens (15) whose principal plane is mounted in the proximity of the diffraction intermediate image plane and a phase-shifting element (16) which is mounted in or in the proximity of the diffraction intermediate image plane. Also, a phase contrast electron microscope has an objective (8) having a back focal plane (10), a first diffraction lens (11), a first phase-shifting element and a second phase-shifting element which is mounted in or in the proximity of the diffraction intermediate image plane. The first diffraction lens (11) images the back focal plane of the objective magnified into a diffraction intermediate image plane and the first phase-shifting element is mounted in the back focal plane (10) of the objective (8). With the magnified imaging of the diffraction plane by the diffraction lens, the dimensional requirements imposed on the phase plate having the phase-shifting element are reduced.

摘要翻译： 相差电子显微镜具有物镜（8），具有后焦平面（10），第一衍射透镜（11），其将物镜（8）的后焦平面（10）成像放大到衍射中间像平面 ，其主平面安装在衍射中间像平面附近的第二衍射透镜（15）和安装在衍射中间像平面附近或附近的相移元件（16）。 此外，相位对比电子显微镜具有物镜（8），其具有后焦平面（10），第一衍射透镜（11），第一相移元件和第二相移元件，其安装在或 接近衍射中间像平面。 第一衍射透镜（11）将放大的物镜的后焦平面成像为衍射中间像平面，第一相移元件安装在物镜（8）的后焦平面（10）中。 通过衍射透镜对衍射平面的放大成像，施加在具有相移元件的相位板上的尺寸要求减小。

公开(公告)号：US07741602B2

公开(公告)日：2010-06-22

申请号：US11717201

申请日：2007-03-13

申请人： Gerd Benner ,  Marko Matijevic

发明人： Gerd Benner ,  Marko Matijevic

IPC分类号： G01N23/00

CPC分类号： H01J37/26 ,  G01N23/04 ,  H01J37/04 ,  H01J2237/0492 ,  H01J2237/2614

摘要： A phase contrast electron microscope has an objective (8) with a back focal plane (10), a first diffraction lens (11), which images the back focal plane (10) of the objective (8) magnified into a diffraction intermediate image plane, a second diffraction lens (15) whose principal plane is mounted in the proximity of the diffraction intermediate image plane and a phase-shifting element (16) which is mounted in or in the proximity of the diffraction intermediate image plane. Also, a phase contrast electron microscope has an objective (8) having a back focal plane (10), a first diffraction lens (11), a first phase-shifting element and a second phase-shifting element which is mounted in or in the proximity of the diffraction intermediate image plane. The first diffraction lens (11) images the back focal plane of the objective magnified into a diffraction intermediate image plane and the first phase-shifting element is mounted in the back focal plane (10) of the objective (8). With the magnified imaging of the diffraction plane by the diffraction lens, the dimensional requirements imposed on the phase plate having the phase-shifting element are reduced.

公开(公告)号：US20070284528A1

公开(公告)日：2007-12-13

申请号：US11717201

申请日：2007-03-13

申请人： Gerd Benner ,  Marko Matijevic

发明人： Gerd Benner ,  Marko Matijevic

IPC分类号： G01N23/00

CPC分类号： H01J37/26 ,  G01N23/04 ,  H01J37/04 ,  H01J2237/0492 ,  H01J2237/2614

摘要： A phase contrast electron microscope has an objective (8) with a back focal plane (10), a first diffraction lens (11), which images the back focal plane (10) of the objective (8) magnified into a diffraction intermediate image plane, a second diffraction lens (15) whose principal plane is mounted in the proximity of the diffraction intermediate image plane and a phase-shifting element (16) which is mounted in or in the proximity of the diffraction intermediate image plane. Also, a phase contrast electron microscope has an objective (8) having a back focal plane (10), a first diffraction lens (11), a first phase-shifting element and a second phase-shifting element which is mounted in or in the proximity of the diffraction intermediate image plane. The first diffraction lens (11) images the back focal plane of the objective magnified into a diffraction intermediate image plane and the first phase-shifting element is mounted in the back focal plane (10) of the objective (8). With the magnified imaging of the diffraction plane by the diffraction lens, the dimensional requirements imposed on the phase plate having the phase-shifting element are reduced.

摘要翻译： 相差电子显微镜具有物镜（8），具有后焦平面（10），第一衍射透镜（11），其将物镜（8）的后焦平面（10）成像放大到衍射中间像平面 ，其主平面安装在衍射中间像平面附近的第二衍射透镜（15）和安装在衍射中间像平面附近或附近的相移元件（16）。 此外，相位对比电子显微镜具有物镜（8），其具有后焦平面（10），第一衍射透镜（11），第一相移元件和第二相移元件，其安装在或 接近衍射中间像平面。 第一衍射透镜（11）将放大的物镜的后焦平面成像为衍射中间像平面，第一相移元件安装在物镜（8）的后焦平面（10）中。 通过衍射透镜对衍射平面的放大成像，施加在具有相移元件的相位板上的尺寸要求减小。