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公开(公告)号：US20140085638A1
公开(公告)日：2014-03-27
申请号：US13629320
申请日：2012-09-27
摘要： Systems and methods for opto electric properties are provided. A light source illuminates a sample. A reference detector senses light from the light source. A sample detector receives light from the sample. A positioning fixture allows for relative positioning of the sample or the light source with respect to each other. An electrical signal device measures the electrical properties of the sample. The reference detector, sample detector and electrical signal device provide information that may be processed to determine opto-electric properties of the same.
摘要翻译： 提供了光电特性的系统和方法。 光源照亮样品。 参考探测器感测来自光源的光。 样品检测器接收来自样品的光。 定位夹具允许样品或光源相对于彼此的相对定位。 电信号装置测量样品的电性能。 参考检测器，样品检测器和电信号装置提供可以被处理以确定其光电特性的信息。
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公开(公告)号：US08836944B2
公开(公告)日：2014-09-16
申请号：US13629320
申请日：2012-09-27
摘要： Systems and methods for opto electric properties are provided. A light source illuminates a sample. A reference detector senses light from the light source. A sample detector receives light from the sample. A positioning fixture allows for relative positioning of the sample or the light source with respect to each other. An electrical signal device measures the electrical properties of the sample. The reference detector, sample detector and electrical signal device provide information that may be processed to determine opto-electric properties of the same.
摘要翻译： 提供了光电特性的系统和方法。 光源照亮样品。 参考探测器感测来自光源的光。 样品检测器接收来自样品的光。 定位夹具允许样品或光源相对于彼此的相对定位。 电信号装置测量样品的电性能。 参考检测器，样品检测器和电信号装置提供可以被处理以确定其光电特性的信息。
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