公开(公告)号：US20120116703A1

公开(公告)日：2012-05-10

申请号：US13266027

申请日：2010-04-23

申请人： Nicolas Pavillon ,  Chandra Sekhar Seelamantula ,  Michael Unser ,  Christian Depeursinge

发明人： Nicolas Pavillon ,  Chandra Sekhar Seelamantula ,  Michael Unser ,  Christian Depeursinge

IPC分类号： G06F19/00

CPC分类号： G03H1/0866 ,  G03H2001/0456 ,  G03H2001/0825

摘要： The present invention discloses a method and an apparatus to compute a complex wavefield, referred to as the object wave o, by means of measuring the intensity signal resulting from the interference of the said object wave with a second wave termed the reference wave. The second wave r is assumed to have some non-vanishing mutual coherence with the said object wave o. The reference wave can be obtained from a source or from the object wave itself. The wave may be emitted from sources of variable degree of coherence and can be scattered waves, but also light-emitting molecules, matter waves such as electron beams or acoustical sources. The disclosed method relates to the said “non-linear method” (NLM). The innovation resides in the fact that the NLM improves considerably the bandwidth of the wavefront reconstructed from off-axis interferograms and holograms obtained in a single shot. The advantage is the significant improvement of the resolution of the images obtained from the reconstructed wavefront, i.e. amplitude and phase images. The said method also suppresses the artifacts resulting from the intensity recording of interferograms and holograms. The method is general in the sense that it can be used for any interferometric measurement, provided that it satisfies the simple requirement that the intensity of the reference wave is larger than the intensity of the object wave, and that the object wave modulated by the reference is confined to at least a quadrant of the spectrum. The disclosed method applies to interferometry, holography in optics, electron waves and acoustics. In particular, it can be implemented in phase, fluorescence, luminescence, electron and acoustic microscopy.

摘要翻译： 本发明公开了一种通过测量由所述对象波的干扰产生的强度信号和被称为参考波的第二波来计算称为对象波o的复波的方法和装置。 假设第二波r与所述物体波具有一些不消失的相互一致性。 参考波可以从源或物体波本身获得。 波可以从可变程度的相干源发射，并且可以是散射波，也可以是发光分子，物质波，例如电子束或声源。 所公开的方法涉及所述“非线性方法”（NLM）。 创新在于这样一个事实：NLM显着地改善了从在单次拍摄中获得的离轴干涉图和全息图重构的波前的带宽。 优点是从重建的波阵面获得的图像的分辨率的显着改善，即振幅和相位图像。 所述方法还抑制由干涉图和全息图的强度记录产生的假象。 该方法是通用的，它可以用于任何干涉测量，只要它满足参考波的强度大于对象波的强度的简单要求，并且由参考波调制的物体波 限于光谱的至少一个象限。 所公开的方法适用于干涉测量，光学全息术，电子波和声学。 特别地，它可以在相位，荧光，发光，电子和声学显微镜中实现。