公开(公告)号：US20160187381A1

公开(公告)日：2016-06-30

申请号：US14955545

申请日：2015-12-01

申请人： Sunghoon Jang ,  Minsuk Choi ,  Byungho Choi ,  Taehwan Kim

发明人： Sunghoon Jang ,  Minsuk Choi ,  Byungho Choi ,  Taehwan Kim

IPC分类号： G01R1/067

CPC分类号： G01R1/06722

摘要： A semiconductor test apparatus includes a pogo pin that is provided on a board and is in contact with an inspected object. The pogo pin includes a barrel fixedly disposed on the board, a plunger movably coupled to the barrel, and a conduction film covering the pogo pin. The conduction film contacts a portion of the plunger to be electrically connected to the plunger while being electrically insulated from the barrel.

摘要翻译： 半导体测试装置包括设置在板上并与检测对象接触的弹簧销。 弹簧销包括固定地设置在板上的筒，可移动地联接到筒的柱塞和覆盖弹簧销的导电膜。 导电膜接触柱塞的一部分以与柱塞电绝缘而与柱塞电连接。