MRAM memory with residual write field reset
    1.
    发明授权
    MRAM memory with residual write field reset 失效
    MRAM存储器具有残留写入域复位

    公开(公告)号:US07206223B1

    公开(公告)日:2007-04-17

    申请号:US11297203

    申请日:2005-12-07

    IPC分类号: G11C11/00

    CPC分类号: G11C11/15

    摘要: A magnetoresistive random access memory (MRAM) (900) that is susceptible to a residual magnetic field is compensated during a write operation. A first magnetic field (208) is applied to a memory cell during a first time period, the first magnetic field having a first direction (y) and a first magnitude. A second magnetic field (212) is applied to the memory cell during a second time period and having a second direction (x) and a second magnitude. A third magnetic field (702) is applied to the memory cell during a third time period, wherein the third time period overlaps at least a portion of the second time period, the third magnetic field having a third direction (−y) which is approximately opposite to the first direction of the first magnetic field. Currents are selectively applied through conductors in the memory cell to apply the three magnetic fields.

    摘要翻译: 在写入操作期间补偿易受残余磁场影响的磁阻随机存取存储器(MRAM)(900)。 第一磁场(208)在第一时间周期内被施加到存储单元,第一磁场具有第一方向(y)和第一大小。 第二磁场(212)在第二时间段期间被施加到存储器单元并且具有第二方向(x)和第二大小。 在第三时间段期间,第三磁场(702)被施加到存储器单元,其中第三时间周期与第二时间段的至少一部分重叠,第三磁场具有近似的第三方向(-y) 与第一磁场的第一方向相反。 通过存储单元中的导体选择性地施加电流以施加三个磁场。