公开(公告)号：US06810748B1

公开(公告)日：2004-11-02

申请号：US10344638

申请日：2003-07-01

申请人： Hidetaka Nishida ,  Hiroshi Yamaguchi ,  Nobuaki Kosako

发明人： Hidetaka Nishida ,  Hiroshi Yamaguchi ,  Nobuaki Kosako

IPC分类号： G01N300

CPC分类号： G01N33/20 ,  G01N2203/0071 ,  G01N2203/0218

摘要： A part where a creep void is recognized is observed at an arbitrary magnification by a scanning electron microscope, an optical microscope, and a laser microscope, and the maximum value of creep void crystal grain boundary occupancy is measured in the field of view. The maximum value is applied to a a master curve corrected from the results of a test of simulating an actual machine and a test piece of actual machine size, taking account of internal damage of the machine. Thus the creep lifetime consumption rate of a member is estimated easily with high accuracy.