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公开(公告)号:US5552591A
公开(公告)日:1996-09-03
申请号:US21298
申请日:1993-02-22
申请人: Douglas C. Bossen , Chin-Long Chen , Frederick H. Dill , Douglas S. Goodman , Mu-Yue Hsiao , Paul V. McCann , James M. Mulligan , Ricky A. Rand
发明人: Douglas C. Bossen , Chin-Long Chen , Frederick H. Dill , Douglas S. Goodman , Mu-Yue Hsiao , Paul V. McCann , James M. Mulligan , Ricky A. Rand
CPC分类号: G06K7/10861 , G06K1/126 , G06K19/06028 , G06K7/0166 , G06K2019/06253
摘要: A single width bar code exhibiting inherent self clocking characteristics is provided so as to be particularly useful in the identification of semiconductor wafers in very large scale integrated circuit manufacturing processes. The codes described herein are robust, reliable and highly readable even in the face of relatively high variations in scanning speed. The codes are also desirably dense in terms of character representations per linear centimeter, an important consideration in semiconductor manufacturing wherein space on the chips and the wafer is at a premium. Additionally, a preferred embodiment of the present invention exhibits a minimum number for the maximum number of spaces between adjacent bars in code symbol sequences.
摘要翻译: 提供了具有固有的自身时钟特性的单宽度条形码,以便在非常大规模的集成电路制造工艺中的半导体晶片的识别中特别有用。 即使面对相对高的扫描速度变化,这里描述的代码是鲁棒的,可靠的和高度可读的。 这些代码在每个线性厘米的字符表示方面也是令人满意的,这在半导体制造中是重要的考虑因素,其中芯片和晶片上的空间是非常重要的。 另外,本发明的一个优选实施例在代码符号序列中显示相邻条之间的最大空格数的最小数目。