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    Electrochemical impedance spectroscopy system and methods for determining spatial locations of defects
    1.
    发明授权
    Electrochemical impedance spectroscopy system and methods for determining spatial locations of defects 失效
    电化学阻抗谱系统和确定缺陷空间位置的方法

    公开(公告)号：US07088115B1

    公开(公告)日：2006-08-08

    申请号：US11015427

    申请日：2004-12-16

    申请人： David F. Glenn ,  Gretchen E. Matthern ,  W. Alan Propp ,  Anne W. Glenn ,  Peter G. Shaw

    发明人： David F. Glenn ,  Gretchen E. Matthern ,  W. Alan Propp ,  Anne W. Glenn ,  Peter G. Shaw

    IPC分类号： G01R27/08 ,  G01B5/30

    CPC分类号： G01N33/383 ,  G01N27/026

    摘要： A method and apparatus for determining spatial locations of defects in a material are described. The method includes providing a plurality of electrodes in contact with a material, applying a sinusoidal voltage to a select number of the electrodes at a predetermined frequency, determining gain and phase angle measurements at other of the electrodes in response to applying the sinusoidal voltage to the select number of electrodes, determining impedance values from the gain and phase angle measurements, computing an impedance spectrum for an area of the material from the determined impedance values, and comparing the computed impedance spectrum with a known impedance spectrum to identify spatial locations of defects in the material.

    摘要翻译： 描述了用于确定材料中的缺陷的空间位置的方法和装置。 该方法包括提供与材料接触的多个电极，以预定频率向选定数量的电极施加正弦电压，以响应于将正弦电压施加到电极的另一个电极而确定增益和相位角测量 选择电极数量，根据增益和相位角测量确定阻抗值，根据确定的阻抗值计算材料区域的阻抗谱，并将计算出的阻抗谱与已知阻抗谱进行比较，以识别缺陷的空间位置 材料。