公开(公告)号：US06168449A

公开(公告)日：2001-01-02

申请号：US09359316

申请日：1999-07-23

申请人： Hsiang-Yu Huang ,  Ta-Chou Huang ,  Yuh-Wen Huang ,  Gau-Ching Day ,  Rong-Fang Horng

发明人： Hsiang-Yu Huang ,  Ta-Chou Huang ,  Yuh-Wen Huang ,  Gau-Ching Day ,  Rong-Fang Horng

IPC分类号： H01R1315

CPC分类号： G01R1/0483

摘要： A test socket for an integrated circuit includes a frame body, a number of electrical contacts, two sliding plates, a mechanism for slidingly moving the sliding plates in a horizontal direction, and two elastic elements. When applying a force to the mechanism, the sliding plates slide away from each other to make each ball contact of a ball grid array integrated circuit move downwardly into an associated through-hole of the sliding plate. When the force is removed, returning forces provided by the elastic elements return the sliding plates to their close contact status, and each ball contact is born against by an associated electrical contact and thus retained in the associated through-hole of the sliding plate such that signals from the ball contacts can be outputted via the electrical contacts.

摘要翻译： 用于集成电路的测试插座包括框架体，多个电触点，两个滑动板，用于在水平方向上滑动滑动板的机构和两个弹性元件。 当向机构施加力时，滑板彼此滑动，使得球栅阵列集成电路的每个球接触向下移动到滑板的相关联的通孔中。 当力消除时，由弹性元件提供的返回力将滑板返回到它们的紧密接触状态，并且每个球接触件抵靠相关联的电触头产生，并因此保持在滑板的相关联的通孔中，使得 可以通过电触点输出来自球触点的信号。