公开(公告)号：US20070226563A1

公开(公告)日：2007-09-27

申请号：US11597139

申请日：2005-05-24

申请人： Reinhard Buchner ,  Christian Ebner ,  Stefan Mosel ,  Peter Rauscher ,  Arndt Voigtlander

发明人： Reinhard Buchner ,  Christian Ebner ,  Stefan Mosel ,  Peter Rauscher ,  Arndt Voigtlander

IPC分类号： G01R31/317

CPC分类号： G01R31/318536

摘要： A test method and a test device for testing an integrated circuit are configured to allow for a test device which dispenses with the hardware provision of the boundary scan cells in the device. For this purpose, the boundary scan cells are reproduced by way of a boundary scan program. All functionalities of the chain of boundary scan cells and the TAP interface are fulfilled by the use of the boundary scan program, which is executed by a program-controlled control device that is controlled by the integrated circuit.

摘要翻译： 用于测试集成电路的测试方法和测试设备被配置为允许免除设备中边界扫描单元的硬件提供的测试设备。 为此，通过边界扫描程序再现边界扫描单元。 边界扫描单元链和TAP接口链的所有功能通过使用由集成电路控制的程序控制控制装置执行的边界扫描程序来实现。