公开(公告)号：US5625775A

公开(公告)日：1997-04-29

申请号：US259208

申请日：1994-06-13

申请人： Robert A. Davis ,  Steven A. Keller

发明人： Robert A. Davis ,  Steven A. Keller

IPC分类号： G06F15/16 ,  G06F13/00 ,  G06F15/177 ,  H04M11/06 ,  G06F13/14 ,  G06F13/38

CPC分类号： H04M11/06

摘要： The present invention includes an apparatus for providing communications between two data processing systems. The present invention includes a first data processing system, a second data processing system, and a communications line connecting the first and second data processing systems. Also included is a first interface located on the first data processing system and a second interface located on the second data processing system, wherein the first interface includes means for establishing a connection between the first and second interfaces, means for establishing a session for each application on the first data processing system requiring communication with an application on the second data processing system and wherein the first and second interfaces includes means for controlling communication between the applications having an established session.

摘要翻译： 本发明包括一种用于在两个数据处理系统之间提供通信的装置。 本发明包括第一数据处理系统，第二数据处理系统和连接第一和第二数据处理系统的通信线路。 还包括位于第一数据处理系统上的第一接口和位于第二数据处理系统上的第二接口，其中第一接口包括用于建立第一和第二接口之间的连接的装置，用于为每个应用建立会话的装置 在第一数据处理系统中，需要与第二数据处理系统上的应用程序通信，并且其中第一和第二接口包括用于控制具有已建立会话的应用之间的通信的装置。

公开(公告)号：US5631856A

公开(公告)日：1997-05-20

申请号：US373338

申请日：1995-01-17

申请人： Steven A. Keller ,  Jiann-Chang Lo ,  James C. Mahlbacher

发明人： Steven A. Keller ,  Jiann-Chang Lo ,  James C. Mahlbacher

IPC分类号： G01R1/04 ,  G01R1/067 ,  G01R15/12

CPC分类号： G01R1/04 ,  G01R1/06705

摘要： The sequential order of movements of a number of probes within a circuit test fixture is optimized through the use of an algorithm which sequentially orders test configurations provided in an input list. Each test configuration corresponds to the locations of probes within the fixture as a particular test is performed. In a first pass of the algorithm, for each test configuration, every other test configuration is considered as a next move candidate for which a weighted distance is calculated from the test configuration. Weighting factors reflect the degree of difficulty in moving one direction instead of another. A need to move one probe before another or to move in one direction before another, in order to prevent a collision within the test fixture, is also considered. A predetermined number of next move candidates having the lowest weighted distances are placed in an intermediate list for the test configuration. In a second pass of the algorithm, test configurations are linked, one to another, to form a list reflecting a preferred order of probe movement. In the process of linking with a test configuration, the available next move candidate having the shortest weighted distance is chosen from the intermediate list of the test configuration. If no available next move candidates remain in the intermediate list, the process returns to the first pass of the algorithm to get more next move candidates. Additionally, the algorithm is used to sequentially order individual points for a test fixture having only a single probe.

摘要翻译： 通过使用顺序地对输入列表中提供的测试配置进行排序的算法来优化电路测试夹具内的多个探针的顺序顺序。 执行特定测试时，每个测试配置对应于夹具内探头的位置。 在算法的第一遍中，对于每个测试配置，每个其他测试配置被认为是从测试配置计算加权距离的下一个移动候选。 加权因素反映了移动一个方向而不是另一个方向的困难程度。 还需要将一个探针移动到另一个之前或者在另一个方向上移动到另一个之前，以便防止测试夹具内的碰撞。 具有最低加权距离的预定数量的下一移动候选者被放置在测试配置的中间列表中。 在算法的第二遍中，测试配置彼此相连，以形成反映探测器移动的优选顺序的列表。 在与测试配置链接的过程中，从测试配置的中间列表中选择具有最短加权距离的可用下一移动候选。 如果没有可用的下一个移动候选者保留在中间列表中，则该过程返回到算法的第一遍，以获得更多的下一移动候选。 另外，该算法用于顺序地排列仅具有单个探针的测试夹具的单个点。