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公开(公告)号：US07454980B2
公开(公告)日：2008-11-25
申请号：US11522763
申请日：2006-09-18
CPC分类号： G01N3/22
摘要： A test device comprises a base and a first fixture coupled to the base. The first fixture holds a first portion of an electronic device mounted in the test device. The test device includes a second fixture rotatably coupled to the base and a lever coupled to the second fixture. The second fixture holds a second portion of the electronic device mounted in the test device. The test device also includes an actuator that forcibly moves the lever to rotate the second fixture and apply a torsion stress on the electronic device mounted in the test device. The test device may be used to test the functionality of electronic devices, such as small form-factor disc drives, while under torsion stresses.
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公开(公告)号：US20080066556A1
公开(公告)日：2008-03-20
申请号：US11522763
申请日：2006-09-18
IPC分类号： F16B31/02
CPC分类号： G01N3/22
摘要： A test device comprises a base and a first fixture coupled to the base. The first fixture holds a first portion of an electronic device mounted in the test device. The test device includes a second fixture rotatably coupled to the base and a lever coupled to the second fixture. The second fixture holds a second portion of the electronic device mounted in the test device. The test device also includes an actuator that forcibly moves the lever to rotate the second fixture and apply a torsion stress on the electronic device mounted in the test device. The test device may be used to test the functionality of electronic devices, such as small form-factor disc drives, while under torsion stresses.
摘要翻译： 测试装置包括底座和联接到基座的第一固定件。 第一夹具保持安装在测试装置中的电子装置的第一部分。 测试装置包括可旋转地联接到基座的第二夹具和联接到第二夹具的杆。 第二夹具保持安装在测试装置中的电子装置的第二部分。 测试装置还包括致动器，其强制地移动杆以旋转第二固定装置并且在安装在测试装置中的电子装置上施加扭转应力。 测试装置可用于在扭转应力下测试电子设备的功能，例如小尺寸盘驱动器。
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公开(公告)号：US07905155B2
公开(公告)日：2011-03-15
申请号：US12061014
申请日：2008-04-02
申请人： Shang Jiun Wong , Jian Bing Zhao , Swee Tiong Tan , Ying Wang , Chung Poh Ong , Kee Ann Chan
发明人： Shang Jiun Wong , Jian Bing Zhao , Swee Tiong Tan , Ying Wang , Chung Poh Ong , Kee Ann Chan
IPC分类号： G01N17/00
CPC分类号： G01M7/022 , G01M7/06 , G01N2203/022 , G01N2203/0246
摘要： A testing apparatus for testing a device or components of a device is presented. It is desirable to simulate the effects of rotary and other forces as well as environmental factors on various components of devices to optimize design improvements so as to increase the quality of the various components and the device or to increase the length of service of the various components and the device.
摘要翻译： 提出了一种用于测试设备的设备或组件的测试设备。 需要模拟旋转和其他力以及环境因素对设备各部件的影响，以优化设计改进，从而提高各种部件和设备的质量，或增加各种部件的使用寿命 和设备。
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公开(公告)号：US20090249899A1
公开(公告)日：2009-10-08
申请号：US12061014
申请日：2008-04-02
申请人： Shang Jiun Wong , Jian Bing Zhao , Swee Tiong Tan , Ying Wang , Chung Poh Ong , Kee Ann Chan
发明人： Shang Jiun Wong , Jian Bing Zhao , Swee Tiong Tan , Ying Wang , Chung Poh Ong , Kee Ann Chan
IPC分类号： G01N19/00
CPC分类号： G01M7/022 , G01M7/06 , G01N2203/022 , G01N2203/0246
摘要： A testing apparatus for testing a device or components of a device is presented. It is desirable to simulate the effects of rotary and other forces as well as environmental factors on various components of devices to optimize design improvements so as to increase the quality of the various components and the device or to increase the length of service of the various components and the device.
摘要翻译： 提出了一种用于测试设备的设备或组件的测试设备。 需要模拟旋转和其他力以及环境因素对设备各部件的影响，以优化设计改进，从而提高各种部件和设备的质量，或增加各种部件的使用寿命 和设备。
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公开(公告)号：US20090056470A1
公开(公告)日：2009-03-05
申请号：US12266031
申请日：2008-11-06
IPC分类号： G01N3/22
CPC分类号： G01N3/22
摘要： A test device comprises a base and a first fixture coupled to the base. The first fixture holds a first portion of an electronic device mounted in the test device. The test device includes a second fixture rotatably coupled to the base and a lever coupled to the second fixture. The second fixture holds a second portion of the electronic device mounted in the test device. The test device also includes an actuator that forcibly moves the lever to rotate the second fixture and apply a torsion stress on the electronic device mounted in the test device. The test device may be used to test the functionality of electronic devices, such as small form-factor disc drives, while under torsion stresses.
摘要翻译： 测试装置包括底座和联接到基座的第一固定件。 第一夹具保持安装在测试装置中的电子装置的第一部分。 测试装置包括可旋转地联接到基座的第二夹具和联接到第二夹具的杆。 第二夹具保持安装在测试装置中的电子装置的第二部分。 测试装置还包括致动器，其强制地移动杆以旋转第二固定装置并且在安装在测试装置中的电子装置上施加扭转应力。 测试装置可用于在扭转应力下测试电子设备的功能，例如小尺寸盘驱动器。
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公开(公告)号：US07730791B2
公开(公告)日：2010-06-08
申请号：US12266031
申请日：2008-11-06
CPC分类号： G01N3/22
摘要： A test device comprises a base and a first fixture coupled to the base. The first fixture holds a first portion of an electronic device mounted in the test device. The test device includes a second fixture rotatably coupled to the base and a lever coupled to the second fixture. The second fixture holds a second portion of the electronic device mounted in the test device. The test device also includes an actuator that forcibly moves the lever to rotate the second fixture and apply a torsion stress on the electronic device mounted in the test device. The test device may be used to test the functionality of electronic devices, such as small form-factor disc drives, while under torsion stresses.
摘要翻译： 测试装置包括底座和联接到基座的第一固定件。 第一夹具保持安装在测试装置中的电子装置的第一部分。 测试装置包括可旋转地联接到基座的第二夹具和联接到第二夹具的杆。 第二夹具保持安装在测试装置中的电子装置的第二部分。 测试装置还包括致动器，其强制地移动杆以旋转第二固定装置并且在安装在测试装置中的电子装置上施加扭转应力。 测试装置可用于在扭转应力下测试电子设备的功能，例如小尺寸盘驱动器。
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