COVER GLASS FOR SEMICONDUCTOR PACKAGE AND PRODUCTION METHOD THEREOF
    1.
    发明申请
    COVER GLASS FOR SEMICONDUCTOR PACKAGE AND PRODUCTION METHOD THEREOF 有权
    封装玻璃用于半导体封装及其生产方法

    公开(公告)号:US20130165312A1

    公开(公告)日:2013-06-27

    申请号:US13821622

    申请日:2011-09-08

    IPC分类号: C03C3/091 C03C3/087 C03C3/085

    摘要: A cover glass for semiconductor package having thermal expansion coefficient conformable to plastic packages and allowing accurate detection of existence of foreign substances, dusts, etc. in an imaging test always having a low emission amount of alpha-ray, and a related production method. The cover glass comprises, in terms of percentage by mass, of from 58 to 75% of SiO2, of from 1.1 to 20% of Al2O3, of from 0 to 10% of B2O3, of from 0.1 to 20% of Na2O, of from 0 to 11% of K2O, and of from 0 to 20% of alkaline earth metal oxide. The cover glass has average thermal expansion coefficient of from 90 to 180×10−7/° C. in the temperature range of from 30 to 380° C., a Young's modulus of 68 GPa or more, and an emission amount of alpha-ray from the glass of 0.05 c/cm2·hr or less.

    摘要翻译: 一种用于半导体封装的玻璃罩,其具有符合塑料封装的热膨胀系数,并且允许在始终具有低发射量的α射线的成像测试中精确检测异物,灰尘等的存在以及相关的制造方法。 覆盖玻璃以质量%计含有SiO 2的58〜75%,Al 2 O 3的1.1〜20%,B 2 O 3的0〜10%,Na 2 O的0.1〜20% 0〜11%的K2O,和0〜20%的碱土金属氧化物。 覆盖玻璃在30〜380℃的温度范围内的平均热膨胀系数为90〜180×10-7 /℃,杨氏模量为68GPa以上, 从0.05c / cm 2·小时以下的玻璃射出。

    Cover glass for semiconductor package and production method thereof
    2.
    发明授权
    Cover glass for semiconductor package and production method thereof 有权
    半导体封装用盖玻璃及其制造方法

    公开(公告)号:US09269742B2

    公开(公告)日:2016-02-23

    申请号:US13821622

    申请日:2011-09-08

    摘要: A cover glass for semiconductor package having thermal expansion coefficient conformable to plastic packages and allowing accurate detection of existence of foreign substances, dusts, etc. in an imaging test always having a low emission amount of alpha-ray, and a related production method. The cover glass comprises, in terms of percentage by mass, of from 58 to 75% of SiO2, of from 1.1 to 20% of Al2O3, of from 0 to 10% of B2O3, of from 0.1 to 20% of Na2O, of from 0 to 11% of K2O, and of from 0 to 20% of alkaline earth metal oxide. The cover glass has average thermal expansion coefficient of from 90 to 180×10−7/° C. in the temperature range of from 30 to 380° C., a Young's modulus of 68 GPa or more, and an emission amount of alpha-ray from the glass of 0.05 c/cm2·hr or less.

    摘要翻译: 一种用于半导体封装的玻璃罩,其具有符合塑料封装的热膨胀系数,并且允许在始终具有低发射量的α射线的成像测试中精确检测异物,灰尘等的存在以及相关的制造方法。 覆盖玻璃以质量%计含有SiO 2的58〜75%,Al 2 O 3的1.1〜20%,B 2 O 3的0〜10%,Na 2 O的0.1〜20% 0〜11%的K2O,和0〜20%的碱土金属氧化物。 覆盖玻璃在30〜380℃的温度范围内的平均热膨胀系数为90〜180×10-7 /℃,杨氏模量为68GPa以上, 从0.05c / cm 2·小时以下的玻璃射出。