公开(公告)号：US06421798B1

公开(公告)日：2002-07-16

申请号：US09353704

申请日：1999-07-14

申请人： Lixin Lin ,  Liming Qu ,  Bing Zhang ,  Toh Kay Huat

发明人： Lixin Lin ,  Liming Qu ,  Bing Zhang ,  Toh Kay Huat

IPC分类号： G11C2900

CPC分类号： G11C29/56

摘要： A method of testing memory of a system is disclosed which operates the system from a second area of system address space which is outside of a first area of system address space, the system having one or more physical memory devices associated with the first area of system address space. The memory locations associated with the first area of the system address space are tested for predetermined characteristics after which the one or more tested physical memory devices are replaced with respective untested physical memory devices without dropping power to the system, and tested by repeating the test cycle. The system is prevented from operating in the first area of system address space and forced to operate from the second area, thereby preventing system interruptions when replacing the physical memory devices for testing.

摘要翻译： 公开了一种测试系统的存储器的方法，其从位于系统地址空间的第一区域之外的系统地址空间的第二区域操作系统，该系统具有与系统的第一区域相关联的一个或多个物理存储器设备 地址空间。 测试与系统地址空间的第一区域相关联的存储器位置的预定特性，之后一个或多个测试的物理存储器件被相应的未测试的物理存储器件替换，而不会向系统掉电，并通过重复测试周期 。 该系统被阻止在系统地址空间的第一区域中操作并被强制从第二区域操作，从而在更换物理存储器件进行测试时防止系统中断。