摘要:
Hidden or overlapped peaks may occur when using SSTDR technology to determine ware faults. These hidden/overlapped peaks may cause false negative determinations (no fault) when testing a wire for faults. In one method of the present invention, the symmetrical property of the SSTDR wave envelope is used to resolve hidden/overlapped peaks. In another method of the present invention, the calibrated normalized loop back SSTDR wave envelope may be used to resolve hidden/overlapped peaks.
摘要:
Hidden or overlapped peaks may occur when using SSTDR technology to determine ware faults. These hidden/overlapped peaks may cause false negative determinations (no fault) when testing a wire for faults. In one method of the present invention, the symmetrical property of the SSTDR wave envelope is used to resolve hidden/overlapped peaks. In another method of the present invention, the calibrated normalized loop back SSTDR wave envelope may be used to resolve hidden/overlapped peaks.