公开(公告)号：US07279907B2

公开(公告)日：2007-10-09

申请号：US11364792

申请日：2006-02-28

申请人： Wai Khuin Phoon ,  Vivien Wong ,  Wah Yew Tan

发明人： Wai Khuin Phoon ,  Vivien Wong ,  Wah Yew Tan

IPC分类号： G01R27/28

CPC分类号： G01R31/024

摘要： A method of testing for power and ground continuity of a semiconductor device having Input and Output (IO) pins and at least a pair of power and ground pins includes identifying the power and ground pins of the device. A victim pin is selected from the IO pins of the device for each pair of the power and ground pins, and an aggressor pin for each victim pin is selected from the remaining IO pins. The aggressor pins are toggled between a high state and a low state. A level of switching noise on each victim pin is measured, and the measured levels of switching noise are compared with predetermined data to determine power and ground continuity of the device.