公开(公告)号：US07275188B1

公开(公告)日：2007-09-25

申请号：US10683205

申请日：2003-10-10

Applicant: Moussa Sobaiti ,  Robert Shrank ,  Sudhakar Reddy ,  Yousif Jirjis

Inventor： Moussa Sobaiti ,  Robert Shrank ,  Sudhakar Reddy ,  Yousif Jirjis

IPC: G11C29/10 ,  G11C29/02

CPC classification number: G11C29/06 ,  G11C15/00 ,  G11C29/12 ,  G11C2029/5602

Abstract: A method and apparatus for burn-in of semiconductor devices is disclosed. A semiconductor device that includes built-in self test circuitry is coupled to a socket on a burn-in board. The burn in board and the semiconductor device are heated. Burn-in instructions can be transmitted to the semiconductor device through a JTAG terminal of the semiconductor device. Upon receiving a burn-in instruction through a JTAG terminal, the built-in self test circuitry is operable to perform one or more burn-in function. This allows for burn-in of a semiconductor device without any transfer of data through the data input terminals of the semiconductor device.

Abstract translation: 公开了一种用于老化半导体器件的方法和装置。 包括内置自检电路的半导体器件耦合到老化板上的插座。 板上的燃烧和半导体器件被加热。 老化指令可以通过半导体器件的JTAG端子传输到半导体器件。 当通过JTAG端子接收到老化指令时，内置的自检电路可以执行一个或多个老化功能。 这允许半导体器件的老化，而不会通过半导体器件的数据输入端子传输数据。