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公开(公告)号:US08318094B1
公开(公告)日:2012-11-27
申请号:US13162433
申请日:2011-06-16
申请人: Hovig Bayandorian , Yujuan Cheng , John Dixon , Kevin Hester , Yanqiao Huang , Paul Lundquist , Joy Roy , Stephen Turner , Peiqian Zhao , Cheng Frank Zhong
发明人: Hovig Bayandorian , Yujuan Cheng , John Dixon , Kevin Hester , Yanqiao Huang , Paul Lundquist , Joy Roy , Stephen Turner , Peiqian Zhao , Cheng Frank Zhong
IPC分类号: G01N31/00
CPC分类号: G01N21/645 , G01N35/0099 , G01N2021/6417 , G01N2035/00039 , Y10T436/11
摘要: This invention provides systems for analyzing substrates. Also provided by the invention are improved optical systems for enhanced multiplex illumination, optical systems with compact multi-wavelength illumination architectures, optical systems for enhanced detection of optical signals, and optical systems for reduced autofluorescence background noise.
摘要翻译: 本发明提供了用于分析衬底的系统。 本发明还提供了用于增强多重照明的改进的光学系统,具有紧凑的多波长照明结构的光学系统,用于增强光信号的检测的光学系统以及用于减少自发荧光背景噪声的光学系统。