公开(公告)号：US06411085B1

公开(公告)日：2002-06-25

申请号：US09529741

申请日：2000-04-18

申请人： Michael Siegel ,  Yuri Tavrin ,  Karl Schreiber ,  Armin Plath

发明人： Michael Siegel ,  Yuri Tavrin ,  Karl Schreiber ,  Armin Plath

IPC分类号： G01R3312

CPC分类号： G01R33/022 ,  G01N27/82

摘要： A depth and other characteristics of a ferromagnetic impurity in a workpiece of nonmagnetic material can be determined after demagnetizing of the workpiece by magnetizing the workpiece in a uniform field, preferably to saturation, and thereafter taking measurements of the field strength from the impurity at two different distances, forming a quotient or ratio of the measured values and determining the depth from a curve in which the signal ratio or quotient is plotted against the depth.

摘要翻译： 在非磁性材料的工件中的铁磁性杂质的深度和其它特性可以通过在均匀的场中磁化工件而进行工件的去磁来确定，优选地达到饱和，然后测量来自两种不同的杂质的场强 距离，形成测量值的商或比例，并从信号比或商对其深度的曲线确定深度。