公开(公告)号：US20070217489A1

公开(公告)日：2007-09-20

申请号：US10582091

申请日：2003-12-11

申请人： Maya Bar-El ,  Zeev Litichever

发明人： Maya Bar-El ,  Zeev Litichever

IPC分类号： H04B3/32

CPC分类号： H04B3/32

摘要： In a communications system having a first modem transmitting via a communications channel, a method for adding a second modem, the method including learning crosstalk caused by transmissions from the first modem to the second modem while the second modem is in a transmitting state insufficient to cause crosstalk interference to the first modem in accordance with a predefined measure, deriving from the learned crosstalk an estimation of crosstalk that would be caused by the second modem to the first modem when the second modem is in a transmitting state, configuring the first modem to cancel crosstalk according to the crosstalk estimation, causing the second modem to enter a transmitting state sufficient to cause crosstalk interference to the first modem in accordance with a predefined measure, and causing the first modem to at least partially cancel crosstalk caused by the second modem in accordance with the crosstalk estimation.

摘要翻译： 在具有经由通信信道的第一调制解调器发送的通信系统中，添加第二调制解调器的方法，所述方法包括由第一调制解调器到第二调制解调器的传输引起的学习串扰，而第二调制解调器处于不足以导致 根据预先确定的措施对第一调制解调器的串扰干扰，从第二调制解调器处于发送状态时，从学习的串扰导出由第二调制解调器对第一调制解调器引起的串扰的估计，配置第一调制解调器以取消 根据串扰估计的串扰，使得第二调制解调器根据预定的措施进入足以引起对第一调制解调器的串扰干扰的发送状态，并且使得第一调制解调器至少部分地消除由第二调制解调器引起的串扰 具有串扰估计。

公开(公告)号：US20080181484A1

公开(公告)日：2008-07-31

申请号：US11700408

申请日：2007-01-31

申请人： Zeev Litichever ,  Erez Sali ,  Oren Cohen

发明人： Zeev Litichever ,  Erez Sali ,  Oren Cohen

IPC分类号： G06K9/00

CPC分类号： G06T7/001 ,  G06T2207/10056 ,  G06T2207/30148

摘要： Inspection of objects such as semiconductor wafers may proceed on a cell-to-cell or die-to-die basis. An image of a wafer may be obtained and the cells or dies shown therein can be inspected using any combination of appropriate die-to-die or cell-to-cell inspection methods. For example, one or more areas may be designated for cell-to-cell inspection. For each cell type, a reference image can be generated by obtaining an image of the area and displacing the image by an amount equal to the repetition vector for that cell type in opposite directions. The displaced images and the original image can be combined into a single reference image. The original image can then be compared to the reference image. In some embodiments, the displaced images are also compared to the reference image to statistically determine the presence or absence of defects.

摘要翻译： 诸如半导体晶片的物体的检查可以在细胞间或细胞死亡的基础上进行。 可以获得晶片的图像，并且可以使用适当的芯片到芯片或细胞间细胞检查方法的任何组合来检查其中所示的细胞或裸片。 例如，可以将一个或多个区域指定用于细胞到细胞检查。 对于每个单元格类型，可以通过获得该区域的图像并且将图像移位相当于相反方向上该单元格类型的重复向量的量来产生参考图像。 移位图像和原始图像可以组合成单个参考图像。 然后将原始图像与参考图像进行比较。 在一些实施例中，也将移位的图像与参考图像进行比较，以统计确定缺陷的存在或不存在。

公开(公告)号：US07869643B2

公开(公告)日：2011-01-11

申请号：US11700408

申请日：2007-01-31

申请人： Zeev Litichever ,  Erez Sali ,  Oren Cohen

发明人： Zeev Litichever ,  Erez Sali ,  Oren Cohen

IPC分类号： G06K9/00 ,  G06K9/68

CPC分类号： G06T7/001 ,  G06T2207/10056 ,  G06T2207/30148

摘要： Inspection of objects such as semiconductor wafers may proceed on a cell-to-cell or die-to-die basis. An image of a wafer may be obtained and the cells or dies shown therein can be inspected using any combination of appropriate die-to-die or cell-to-cell inspection methods. For example, one or more areas may be designated for cell-to-cell inspection. For each cell type, a reference image can be generated by obtaining an image of the area and displacing the image by an amount equal to the repetition vector for that cell type in opposite directions. The displaced images and the original image can be combined into a single reference image. The original image can then be compared to the reference image. In some embodiments, the displaced images are also compared to the reference image to statistically determine the presence or absence of defects.

摘要翻译： 诸如半导体晶片的物体的检查可以在细胞间或细胞死亡的基础上进行。 可以获得晶片的图像，并且可以使用适当的芯片到芯片或细胞间细胞检查方法的任何组合来检查其中所示的细胞或裸片。 例如，可以将一个或多个区域指定用于细胞到细胞检查。 对于每个单元格类型，可以通过获得该区域的图像并且将图像移位相当于相反方向上该单元格类型的重复向量的量来产生参考图像。 移位图像和原始图像可以组合成单个参考图像。 然后将原始图像与参考图像进行比较。 在一些实施例中，也将移位的图像与参考图像进行比较，以统计确定缺陷的存在或不存在。

公开(公告)号：US07613235B2

公开(公告)日：2009-11-03

申请号：US10582091

申请日：2003-12-11

申请人： Maya Bar-El ,  Zeev Litichever

发明人： Maya Bar-El ,  Zeev Litichever

IPC分类号： H04B1/38

CPC分类号： H04B3/32

摘要： In a communications system having a first modem transmitting via a communications channel, a method for adding a second modem, the method including learning crosstalk caused by transmissions from the first modem to the second modem while the second modem is in a transmitting state insufficient to cause crosstalk interference to the first modem in accordance with a predefined measure, deriving from the learned crosstalk an estimation of crosstalk that would be caused by the second modem to the first modem when the second modem is in a transmitting state, configuring the first modem to cancel crosstalk according to the crosstalk estimation, causing the second modem to enter a transmitting state sufficient to cause crosstalk interference to the first modem in accordance with a predefined measure, and causing the first modem to at least partially cancel crosstalk caused by the second modem in accordance with the crosstalk estimation.

摘要翻译： 在具有经由通信信道的第一调制解调器发送的通信系统中，添加第二调制解调器的方法，所述方法包括由第一调制解调器到第二调制解调器的传输引起的学习串扰，而第二调制解调器处于不足以导致 根据预先确定的措施对第一调制解调器的串扰干扰，从第二调制解调器处于发送状态时，从学习的串扰导出由第二调制解调器对第一调制解调器引起的串扰的估计，配置第一调制解调器以取消 根据串扰估计的串扰，使得第二调制解调器根据预定的措施进入足以引起对第一调制解调器的串扰干扰的发送状态，并且使得第一调制解调器至少部分地消除由第二调制解调器引起的串扰 具有串扰估计。