Current interrupt devices using shape memory materials

    公开(公告)号:US11476551B2

    公开(公告)日:2022-10-18

    申请号:US16048765

    申请日:2018-07-30

    摘要: Embodiments described herein relate to current interrupt devices (CIDs) for electrochemical cells that use a thermal trigger (e.g., shape memory and/or bi-metallic materials) to open an electrical circuit just prior to a thermal runaway or during short-circuit event to prevent catastrophic failure of the electrochemical cell. Embodiments include CIDs comprising a housing, a bus bar coupled to the housing, and a thermal trigger operably coupled to the bus bar. In some embodiments, the bus bar can include an engineered fracture site. In some embodiments, the thermal trigger is dimensioned and configured to deform at a predetermined temperature to break the bus bar at the engineered fracture site. In some embodiments, a portion of the bus bar travels about a hinge, opening the electrical circuit and preventing overcharging, thermal runaway, and/or other catastrophic failure events.

    Electrochemical cells with one or more segmented current collectors and methods of making the same

    公开(公告)号:US12068486B2

    公开(公告)日:2024-08-20

    申请号:US17339326

    申请日:2021-06-04

    IPC分类号: H01M4/70 H01M50/583

    CPC分类号: H01M4/70 H01M50/583

    摘要: Embodiments described herein relate to electrochemical cells with one or more current collectors divided into segments, and methods of producing the same. A current collector divided into segments comprises a substantially planar conductive material including a connection region and an electrode region. The electrode region includes one or more dividers defining a plurality of electron flow paths. The plurality of electron flow paths direct the flow of electrons from the electrode region to the connection region. In some embodiments, the current collector includes a fuse section disposed between the electrode region and the connection region. In some embodiments, the fuse section can include a thin strip of conductive material, such that the thin strip of conductive material melts at a melting temperature and substantially prevent electron movement between the electrode region and the connection region.

    Current interrupt device based on thermal activation of frangible glass bulb

    公开(公告)号:US11469065B2

    公开(公告)日:2022-10-11

    申请号:US17371662

    申请日:2021-07-09

    摘要: Embodiments described herein relate generally to a current interrupt device (CID) including a frangible bulb that is configured to be thermally triggered. In some embodiments, the CID includes a breaking contact electrically coupled to a fixed contact and held in electrical contact by the frangible bulb. In some embodiments, the frangible bulb is configured to break at a temperature threshold. In some embodiments, the breaking contact is configured to bend, rotate and/or otherwise deform about a hinge point in order to become electrically disconnected from the fixed contact when the frangible bulb breaks. In some embodiments, opening the electrical circuit between the breaking contact and the fixed contact may prevent overcharging, overvoltage conditions, overcurrent conditions, thermal runaway, and/or other catastrophic failure events.

    Current interrupt device based on thermal activation of frangible glass bulb

    公开(公告)号:US11094487B2

    公开(公告)日:2021-08-17

    申请号:US16450231

    申请日:2019-06-24

    摘要: Embodiments described herein relate generally to a current interrupt device (CID) including a frangible bulb that is configured to be thermally triggered. In some embodiments, the CID includes a breaking contact electrically coupled to a fixed contact and held in electrical contact by the frangible bulb. In some embodiments, the frangible bulb is configured to break at a temperature threshold. In some embodiments, the breaking contact is configured to bend, rotate and/or otherwise deform about a hinge point in order to become electrically disconnected from the fixed contact when the frangible bulb breaks. In some embodiments, opening the electrical circuit between the breaking contact and the fixed contact may prevent overcharging, overvoltage conditions, overcurrent conditions, thermal runaway, and/or other catastrophic failure events.