公开(公告)号：US20210278347A1

公开(公告)日：2021-09-09

申请号：US16326635

申请日：2017-09-01

申请人： 3M INNOVATIVE PROPERTIES COMPANY

发明人： Steven P. Floeder ,  Nathaniel S. Rowekamp ,  Xin Yu ,  James A. Masterman ,  Ian A. Edhlund ,  Mark E. Flanzer ,  Scott P. Daniels ,  Matthew V. Rundquist ,  Jeffrey P. Adolf

IPC分类号： G01N21/89 ,  G01N21/892 ,  G01N21/896

摘要： Techniques are described for inspection of films in order to detect Machine Direction Line (“MDL”) defects. An example system comprises a light source configured to provide a source of light rays, directed to a film product so that the light rays are incident to a surface of the film product at a non-perpendicular angle of incidence. An image capturing device is configured to generate an image of the film product by capturing a level of light intensity of the light rays exiting the film product in a plurality of image areas, each image area representing a line imaged across the film product that is perpendicular to a direction of manufacture of the film product. An image processing device is configured to process the image of the film product to provide an indication of the detection of one or more machine direction line (MDL) defects in the film product.