公开(公告)号：US12047231B2

公开(公告)日：2024-07-23

申请号：US17719830

申请日：2022-04-13

Applicant: ABB Schweiz AG

Inventor： Abhilash Gopalakrishnan ,  Jithin Kizhakey Putanvetil ,  Martin Nykvist ,  Jithin M

IPC: H04L41/0806 ,  H04L41/08 ,  H04L41/16 ,  H04L67/00

CPC classification number: H04L41/0806 ,  H04L41/08 ,  H04L41/16 ,  H04L67/34

Abstract: A system and method for configuring an intelligent electronic device (IED) from a plurality of IEDs connected in a communication network of a substation with a computing system includes a computing system communicatively connected in the communication network of the substation for transmitting a configuration of at least one application function to the IED for operating an electrical equipment in the substation. The method for configuring the IED comprises using a virtual model of the IED to generate the IED configurations through a simulation that involves a sequence prediction technique. The sequence prediction technique facilitates generating a sequence of functions arranged in an order and sequentially determining connections between at least one input and at least one output of the one or more functions that comprises the application function. The generated sequence of functions and sequence of connections constitute the IED configuration corresponding to a given application function.

公开(公告)号：US20230318332A1

公开(公告)日：2023-10-05

申请号：US18189709

申请日：2023-03-24

Applicant: ABB Schweiz AG

Inventor： Nishith Patel ,  Samir Mistry ,  Martin Nykvist ,  Pavan Narendra ,  Hubertus Lemmens

IPC: H02J7/00 ,  H02J9/06 ,  H02J7/34

CPC classification number: H02J7/0047 ,  H02J9/061 ,  H02J7/345 ,  H02J2207/50

Abstract: A device assembly including a supply connection adapted to be electrically connected to a power source; a microcontroller; a sensor system adapted to measure at least one environmental parameter; and a supercapacitor. The device assembly has a first operating state, in which power is supplied by a first power supply link from the supply connection to the microcontroller, and a second operating state, in which power is supplied by a second power supply link from the supercapacitor to the microcontroller, and the microcontroller is alternately in an inactive mode and an active mode.

公开(公告)号：US20220239557A1

公开(公告)日：2022-07-28

申请号：US17719830

申请日：2022-04-13

Applicant: ABB Schweiz AG

Inventor： Abhilash Gopalakrishnan ,  Jithin Kizhakey Putanvetil ,  Martin Nykvist ,  Jithin M

IPC: H04L41/0806 ,  H04L67/00 ,  H04L67/12

Abstract: A system and method for configuring an intelligent electronic device (IED) from a plurality of IEDs connected in a communication network of a substation with a computing system includes a computing system communicatively connected in the communication network of the substation for transmitting a configuration of at least one application function to the IED for operating an electrical equipment in the substation. The method for configuring the IED comprises using a virtual model of the IED to generate the IED configurations through a simulation that involves a sequence prediction technique. The sequence prediction technique facilitates generating a sequence of functions arranged in an order and sequentially determining connections between at least one input and at least one output of the one or more functions that comprises the application function. The generated sequence of functions and sequence of connections constitute the IED configuration corresponding to a given application function.

公开(公告)号：US11836036B2

公开(公告)日：2023-12-05

申请号：US17439020

申请日：2020-03-09

Applicant: ABB Schweiz AG

Inventor： Abhilash Gopalakrishnan ,  Jithin Kizhakey Putanvetil ,  Manigandan P ,  Arinjai Gupta ,  Martin Nykvist

IPC: G06F11/00 ,  G06F11/07 ,  G06F11/30 ,  G06F18/2415

CPC classification number: G06F11/079 ,  G06F11/0772 ,  G06F11/3006 ,  G06F18/24155

Abstract: A method for detecting a fault in an intelligent electronic device that includes components uses a Bayesian network. The method includes detecting a failure event in the components, obtaining a first list of cause of failures in the component using a fault tree model, computing probability of the cause of failures to obtain a second list of probable causes of failure by monitoring of information about the elements identified in the first list, identifying a root cause of failure associated with the element comprised in the component using the Bayesian network based on the second list, and initiating a function. The function may be one of restarting the element having the root cause of failure, a filtering operation for input data provided to that element; and providing an alert in the human machine interface associated with the intelligent electronic device.

公开(公告)号：US20220147410A1

公开(公告)日：2022-05-12

申请号：US17439020

申请日：2020-03-09

Applicant: ABB Schweiz AG

Inventor： Abhilash Gopalakrishnan ,  Jithin Kizhakey Putanvetil ,  Manigandan P ,  Arinjai Gupta ,  Martin Nykvist

IPC: G06F11/07 ,  G06F11/30 ,  G06K9/62

Abstract: A method for detecting a fault in an intelligent electronic device that includes components uses a Bayesian network. The method includes detecting a failure event in the components, obtaining a first list of cause of failures in the component using a fault tree model, computing probability of the cause of failures to obtain a second list of probable causes of failure by monitoring of information about the elements identified in the first list, identifying a root cause of failure associated with the element comprised in the component using the Bayesian network based on the second list, and initiating a function. The function may be one of restarting the element having the root cause of failure, a filtering operation for input data provided to that element; and providing an alert in the human machine interface associated with the intelligent electronic device.