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公开(公告)号:US20220206201A1
公开(公告)日:2022-06-30
申请号:US17645786
申请日:2021-12-23
Applicant: AGC Inc. , Optical Coatings Japan
Inventor: Yosuke SUGIHARA , Yasuyuki TAKIMOTO , Takahiro MASHIMO , Atsushi KOYANAGI , Naoto TATSUOKA , Masaaki MIYAKE , Hideaki TAKAHOSHI
Abstract: An optical filter includes a substrate and a dielectric multilayer film laid as an outermost layer on at least one major surface of the substrate. The dielectric multilayer film includes a low-refractive index film and a high-refractive index film provided alternately. At least one film selected from the group consisting of the low-refractive index film and the high-refractive index film satisfies the following optical characteristics (i-1) and (i-2A): (i-1) an extinction coefficient k600 at a wavelength of 600 nm is 0.12 or larger; and (i-2A) a minimum extinction coefficient k1530-1570MIN in a wavelength range of 1530 to 1570 nm is 0.01 or smaller; and the optical filter satisfies the following optical characteristic (ii-1A): (ii-1A) light in a wavelength range of 400 to 680 nm is blocked and light in the wavelength range of 1530 to 1570 nm is transmitted.
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公开(公告)号:US20220145697A1
公开(公告)日:2022-05-12
申请号:US17580205
申请日:2022-01-20
Applicant: AGC Inc.
Inventor: Shunya TAKI , Naoko OKADA , Yasuyuki TAKIMOTO , Haruhiko YOSHINO
Abstract: A laminated body includes a transparent substrate having a laminated film. The laminated film includes a dielectric layer containing silicon nitride, a barrier layer composed of a single film or two or more films, and a metal layer containing silver. The barrier layer has a thickness of from 0.1 nm to 10 nm. Each film of the barrier layer includes a material having a crystal structure of a face-centered cubic structure with a lattice constant of from 3.5 to 4.2, a hexagonal close-packed structure with a lattice constant of from 2.6 to 3.3, a body-centered cubic structure with a lattice constant of from 2.9 to 3.2, or a tetragonal crystal with a lattice constant of from 2.9 to 4.4. The metal layer has a thickness of from 7 nm to 25 nm. An orientation index P of the metal layer falls within a range from 4.5 to 20.
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