公开(公告)号：US20170269161A1

公开(公告)日：2017-09-21

申请号：US15505004

申请日：2015-08-19

Applicant: ALSTOM TECHNOLOGY LTD

Inventor： David Reginald TRAINER ,  Si DANG ,  Francisco Jose MORENO MUNOZ ,  John VODDEN

IPC: G01R31/333

CPC classification number: G01R31/3336 ,  G01R31/3274 ,  H02M2007/4835

Abstract: A synthetic test circuit, for performing an electrical test on a device under test, is provided. The circuit includes a terminal connectable to the device under test; a voltage injection circuit-operably connected to the terminal, the voltage injection circuit including a voltage source, the voltage source including a chain-link converter, the chain-link converter including a plurality of modules, each module including a plurality of module switches connected with at least one energy storage device; and a controller-configured to operate each module of the voltage injection circuit to selectively bypass the or each corresponding energy storage device and insert the or each corresponding energy storage device into the chain-link converter so as to generate a voltage across the chain-link converter and thereby operate the voltage injection circuit to inject a unidirectional voltage waveform into the device under test.