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公开(公告)号:US09915929B1
公开(公告)日:2018-03-13
申请号:US14502683
申请日:2014-09-30
Applicant: Amazon Technologies, Inc.
Inventor: David Magee Dubinsky , Kris Scott Steigerwald , Steven Richard Stolarski , Kraig Knight , Shelton George Gregory
Abstract: Disclosed herein is a platform for monitoring the availability of facility equipment. The platform may include a facility equipment monitoring tool with access to configuration data for one or more facilities. The platform allows for deployment of a mobile client application across a plurality of mobile devices to facilitate performance of walk-through inspections (i.e., rounds) of equipment within respective facilities, and to provide real-time equipment availability indicators and other status indicators via a user interface of the application. The data collected during walk-through inspections may be logged and uploaded to a central server system and stored in a data repository. The platform may further provide a network-accessible monitoring dashboard for viewing real-time, and historical, data regarding the walk-through inspections performed at various facilities, and an administrative user interface to update configuration data in the data repository of the central server system.
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公开(公告)号:US09853827B1
公开(公告)日:2017-12-26
申请号:US14741199
申请日:2015-06-16
Applicant: Amazon Technologies, Inc.
CPC classification number: H04L12/2809 , H04L12/281 , H04L41/12
Abstract: Techniques and solutions are provided for performing automated device discovery over a network operating according to the building automation and control network (BACnet) protocol standard (a BACnet network). For example, automated device discovery on a BACnet network can be performed via automated processing of BACnet traffic without going through a manual discovery and configuration process, and without binding to BACnet devices. For example, who-is and I-am BACnet messages can be used to identify BACnet devices on the network and their property values can be read and displayed (e.g., in a dashboard interface). BACnet devices can also be queried to determine their supported properties.
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