公开(公告)号：US10932072B2

公开(公告)日：2021-02-23

申请号：US16375551

申请日：2019-04-04

Applicant: Analog Devices, Inc.

Inventor： Tyler Ray ,  Nicholas J. Jakse ,  Neal Tait Kurfiss ,  Christopher M. Hanna ,  Miguel A. Chavez ,  Joshua Berlin

IPC: H04R29/00 ,  H04R23/00 ,  G01S7/48 ,  G01S17/50

Abstract: Systems and methods for optically measuring displacement of an element include an emitter for emitting an optical signal, a first detector for detecting reflections of the optical signal from the element, a second detector for detecting reflections of the optical signal from a raised cover structure, a processor for receiving the detected reflections from the first and second detectors and removing distortions in the detected reflections from the first detector using the detected reflections from the second detector.