公开(公告)号：US10782441B2

公开(公告)日：2020-09-22

申请号：US15496162

申请日：2017-04-25

Applicant: Analogic Corporation

Inventor： Kevin Brennan ,  William Davidson ,  Patrick Splinter

IPC: G01V5/00 ,  G06T19/00 ,  G06T11/00

Abstract: An X-ray inspection system includes at least one display monitor and a console. The console includes at least two different visualization algorithms and a processor. The processor is configured to process volumetric image data with a first of the at least two different visualization algorithms and produce a first processed volumetric image. The processor is further configured to process the volumetric image data with a second of the at least two different visualization algorithms and produce a second processed volumetric image. The processor is further configured to concurrently display the first and second processed volumetric image data via the display monitor. The volumetric image data is indicative of a scanned object and items therein.

公开(公告)号：US20180308255A1

公开(公告)日：2018-10-25

申请号：US15496162

申请日：2017-04-25

Applicant: Analogic Corporation

Inventor： Kevin BRENNAN ,  William Davidson ,  Patrick Splinter

IPC: G06T7/90 ,  G01V5/00

Abstract: An X-ray inspection system includes at least one display monitor and a console. The console includes at least two different visualization algorithms and a processor. The processor is configured to process volumetric image data with a first of the at least two different visualization algorithms and produce first processed volumetric image. The processor is further configured to process the volumetric image data with a second of the at least two different visualization algorithms and produce second processed volumetric image. The processor is further configured to concurrently display the first and second processed volumetric image data via the display monitor. The volumetric image data is indicative of a scanned object and items therein.