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公开(公告)号:US20240272629A1
公开(公告)日:2024-08-15
申请号:US18637074
申请日:2024-04-16
Applicant: Andritz Inc.
Inventor: Neeraj Nagpal , Peter Antensteiner
IPC: G05B19/418
CPC classification number: G05B19/41875 , G05B2219/32201 , G05B2219/32368
Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for optimizing material processing. In one aspect, a method includes collecting, from a set of sensors, a set of current manufacturing conditions. Based on the set of current manufacturing conditions collected from the sensors, a set of current qualities of a material currently being processed by manufacturing equipment is determined. A baseline production measure for processing the material according to the set of current qualities is obtained. A candidate set of manufacturing conditions that provide an improved production measure relative to the baseline production measure is determined. A set of candidate qualities for the material produced under the candidate set of manufacturing conditions is determined. A visualization that presents both of the set of candidate qualities of the material and the set of current qualities of the material currently being processed is generated.
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公开(公告)号:USD916890S1
公开(公告)日:2021-04-20
申请号:US29675354
申请日:2018-12-31
Applicant: Andritz Inc.
Designer: Neeraj Nagpal , Peter Antensteiner
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公开(公告)号:US20230273608A1
公开(公告)日:2023-08-31
申请号:US18143696
申请日:2023-05-05
Applicant: Andritz Inc.
Inventor: Neeraj Nagpal , Peter Antensteiner
IPC: G05B19/418
CPC classification number: G05B19/41875 , G05B2219/32201 , G05B2219/32368
Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for optimizing material processing. In one aspect, a method includes collecting, from a set of sensors, a set of current manufacturing conditions. Based on the set of current manufacturing conditions collected from the sensors, a set of current qualities of a material currently being processed by manufacturing equipment is determined. A baseline production measure for processing the material according to the set of current qualities is obtained. A candidate set of manufacturing conditions that provide an improved production measure relative to the baseline production measure is determined. A set of candidate qualities for the material produced under the candidate set of manufacturing conditions is determined. A visualization that presents both of the set of candidate qualities of the material and the set of current qualities of the material currently being processed is generated.
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公开(公告)号:US11681280B2
公开(公告)日:2023-06-20
申请号:US16710243
申请日:2019-12-11
Applicant: Andritz Inc.
Inventor: Neeraj Nagpal , Peter Antensteiner
IPC: G06F19/00 , G05B19/418
CPC classification number: G05B19/41875 , G05B2219/32201 , G05B2219/32368
Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for optimizing material processing. In one aspect, a method includes collecting, from a set of sensors, a set of current manufacturing conditions. Based on the set of current manufacturing conditions collected from the sensors, a set of current qualities of a material currently being processed by manufacturing equipment is determined. A baseline production measure for processing the material according to the set of current qualities is obtained. A candidate set of manufacturing conditions that provide an improved production measure relative to the baseline production measure is determined. A set of candidate qualities for the material produced under the candidate set of manufacturing conditions is determined. A visualization that presents both of the set of candidate qualities of the material and the set of current qualities of the material currently being processed is generated.
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公开(公告)号:US20200209839A1
公开(公告)日:2020-07-02
申请号:US16710243
申请日:2019-12-11
Applicant: Andritz Inc.
Inventor: Neeraj Nagpal , Peter Antensteiner
IPC: G05B19/418
Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for optimizing material processing. In one aspect, a method includes collecting, from a set of sensors, a set of current manufacturing conditions. Based on the set of current manufacturing conditions collected from the sensors, a set of current qualities of a material currently being processed by manufacturing equipment is determined. A baseline production measure for processing the material according to the set of current qualities is obtained. A candidate set of manufacturing conditions that provide an improved production measure relative to the baseline production measure is determined. A set of candidate qualities for the material produced under the candidate set of manufacturing conditions is determined. A visualization that presents both of the set of candidate qualities of the material and the set of current qualities of the material currently being processed is generated.
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