公开(公告)号：US20230344533A1

公开(公告)日：2023-10-26

申请号：US18101020

申请日：2023-01-24

Applicant: Apple Inc.

Inventor： Fucheng Wang ,  Fahmi L. Al Sabie ,  Vikas O. Jain ,  In Kwang Kim ,  Abhiram Rudrapatna Sridhar ,  Krishna Kalyanaraman ,  Ashwin Mohan ,  Anatoliy S. Ioffe

IPC: H04B17/318 ,  H04B17/23

CPC classification number: H04B17/318 ,  H04B17/23

Abstract: A testing device determines an Effective Isotropic Radiated Power (EIRP) of a wanted signal at a beam-peak direction and a maximum Total Radiated Power (TRP) of the wanted signal. The testing device then determines a power difference (ΔP) between the EIRP of the wanted signal at the beam-peak direction and the maximum TRP of the wanted signal. The testing device determines EIRP of a spectral emission mask (SEM) at each measurement bandwidth step at the beam-peak direction. The testing device then determines TRP at each measurement bandwidth step by determining a difference between the EIRP of the SEM at that measurement bandwidth step and the power difference (ΔP). The testing device compares the TRP at each measurement bandwidth step to a SEM specification, and reports whether the SEM specification has been met.