公开(公告)号：US09876588B2

公开(公告)日：2018-01-23

申请号：US14477703

申请日：2014-09-04

Applicant: Apple Inc.

Inventor： Chao Yuan ,  Wassim El-Hassan ,  Vishwanath Venkataraman

IPC: H04B17/00 ,  H04B17/16 ,  H04B17/19 ,  H04B17/21

CPC classification number: H04B17/0085 ,  H04B17/16 ,  H04B17/19 ,  H04B17/21

Abstract: Radio-frequency performance of wireless communications circuitry on an electronic device under test (DUT) may be tested without external test equipment such as signal analyzers or signal generators. A first DUT may transmit test signals to a second DUT. External attenuator circuitry interposed between the DUTs may attenuate the test signals to desired power levels. The second DUT may characterize and/or calibrate receiver performance by generating wireless performance metric data based on the attenuated test signals. A single DUT may transmit test signals to itself via corresponding transmit and receive ports coupled together through the attenuator. The DUT may generate performance metric data based on the test signals. The DUT may include feedback receiver circuitry coupled to an output of a transmitter via a feedback path and may characterize and/or calibrate transmit performance using test signals transmitted by the transmitter and received by the feedback receiver.

公开(公告)号：US20160072594A1

公开(公告)日：2016-03-10

申请号：US14477703

申请日：2014-09-04

Applicant: Apple Inc.

Inventor： Chao Yuan ,  Wassim El-Hassan ,  Vishwanath Venkataraman

IPC: H04B17/00

CPC classification number: H04B17/0085 ,  H04B17/16 ,  H04B17/19 ,  H04B17/21

Abstract: Radio-frequency performance of wireless communications circuitry on an electronic device under test (DUT) may be tested without external test equipment such as signal analyzers or signal generators. A first DUT may transmit test signals to a second DUT. External attenuator circuitry interposed between the DUTs may attenuate the test signals to desired power levels. The second DUT may characterize and/or calibrate receiver performance by generating wireless performance metric data based on the attenuated test signals. A single DUT may transmit test signals to itself via corresponding transmit and receive ports coupled together through the attenuator. The DUT may generate performance metric data based on the test signals. The DUT may include feedback receiver circuitry coupled to an output of a transmitter via a feedback, path and may characterize and/or calibrate transmit performance using test signals transmitted by the transmitter and received by the feedback receiver.

Abstract translation: 可以在没有外部测试设备（如信号分析仪或信号发生器）的情况下测试被测电子设备（DUT）上的无线通信电路的射频性能。 第一DUT可以将测试信号发送到第二DUT。 插入在DUT之间的外部衰减器电路可以将测试信号衰减到期望的功率电平。 第二DUT可以通过基于衰减的测试信号产生无线性能度量数据来表征和/或校准接收机性能。 单个DUT可以通过经由衰减器耦合在一起的对应的发射和接收端口将测试信号发送到自身。 DUT可以基于测试信号生成性能度量数据。 DUT可以包括经由反馈路径耦合到发射机的输出的反馈接收器电路，并且可以使用由发射器发送并由反馈接收器接收的测试信号来表征和/或校准发射性能。