公开(公告)号：US20150268273A1

公开(公告)日：2015-09-24

申请号：US14221058

申请日：2014-03-20

Applicant: Apple Inc.

Inventor： Anuranjini Pragada ,  Ming L. Sartee ,  Shin John Choi ,  Joon Kwon ,  Richard Lim ,  Michael McCord

IPC: G01R1/067

CPC classification number: G01N27/041

Abstract: A test probe system including a test probe structure. The test probe system may include the test probe structure including a probe support, and a conductive, conformable component coupled to the probe support. The conductive, conformable component may be configured to: directly contact a test surface of a test structure, or couple a conductive element to the probe support. The conductive element may directly contact the test surface of the test structure. The test probe system may also include a conductive liquid dispensing system coupled to the test probe structure. The conductive liquid dispensing system may be configured to supply a conductive liquid to the test surface of the test structure.

Abstract translation: 包括测试探针结构的测试探针系统。 测试探针系统可以包括测试探针结构，包括探针支架和耦合到探针支架的导电的，适形的部件。 导电的，顺应的部件可以被配置为：直接接触测试结构的测试表面，或将导电元件耦合到探针支架。 导电元件可以直接接触测试结构的测试表面。 测试探针系统还可以包括耦合到测试探针结构的导电液体分配系统。 导电液体分配系统可以被配置为将导电液体供应到测试结构的测试表面。