公开(公告)号：US20150072594A1

公开(公告)日：2015-03-12

申请号：US14022116

申请日：2013-09-09

Applicant: Apple Inc.

Inventor： Duco B. Pasmooij ,  Kee Han Sim ,  Christopher R. Fagan

IPC: B24B55/00 ,  B08B13/00 ,  G01N21/64

CPC classification number: B24B55/00 ,  B08B13/00 ,  B24B29/00 ,  B24B37/005 ,  B24B49/12 ,  G01N21/94 ,  G01N2021/6497

Abstract: Manufacturing methods are provided. A component may be polished to remove defects thereon. An identifier may be added to the polishing material employed to polish the component. A detector may detect the identifier. For example, the identifier may be a fluroescing material that may illuminate in the presence of a fluorescent light. A determining apparatus may determine a status of the component based on the presence or absence of the identifier. For example, the determining apparatus may determine that the component needs to be re-cleaned based on presence of the identifier. Related systems and computer program products are also provided.

Abstract translation: 提供制造方法。 可以抛光组分以除去其上的缺陷。 可以将标识符添加到用于抛光部件的抛光材料中。 检测器可以检测标识符。 例如，标识符可以是在存在荧光的情况下照亮的荧光材料。 确定装置可以基于标识符的存在或不存在来确定组件的状态。 例如，确定装置可以基于标识符的存在来确定组件需要被重新清理。 还提供了相关系统和计算机程序产品。