公开(公告)号：US09541603B2

公开(公告)日：2017-01-10

申请号：US13938901

申请日：2013-07-10

Applicant: Apple Inc.

Inventor： Brian S. Park ,  Patrick D. McNamara ,  Kwang M. Lee ,  Meng C. Chong ,  Geertjan Joordens ,  Raman S. Thiara ,  Anh T. Hoang ,  John P. Gonzalez

IPC: G01R31/00 ,  G01R31/317 ,  G01R19/165 ,  G06F1/28 ,  G01R31/3181

CPC classification number: G01R31/31721 ,  G01R19/16552 ,  G01R31/31816 ,  G06F1/28

Abstract: A method and apparatus for power glitch detection in IC's is disclosed. In one embodiment, a method includes a detection circuit in an IC detecting a voltage transient wherein a value of a supply voltage has at least momentarily fallen below a reference voltage value. Responsive thereto, the detection circuit may cause a logic value to be stored in a register indicating that the detection circuit has detected the supply voltage falling below the reference voltage. The IC may include a number of detection circuits coupled to the register, each of which may provide a corresponding indication of detecting the supply voltage falling below the reference voltage. The detection circuits may be placed at different locations, and thus reading the register may yield information indicating the locations where, if any, such voltage transients occurred.

Abstract translation: 公开了一种用于IC中电源故障检测的方法和装置。 在一个实施例中，一种方法包括检测电压瞬变的IC中的检测电路，其中电源电压的值至少暂时低于参考电压值。 响应于此，检测电路可以使逻辑值存储在指示检测电路已经检测到低于参考电压的电源电压的寄存器中。 IC可以包括耦合到寄存器的多个检测电路，每个检测电路可以提供检测低于参考电压的电源电压的相应指示。 检测电路可以放置在不同的位置，因此读取寄存器可以产生指示出现这种电压瞬变的位置（如果有的话）的信息。

公开(公告)号：US20150015283A1

公开(公告)日：2015-01-15

申请号：US13938901

申请日：2013-07-10

Applicant: Apple Inc.

Inventor： Brian S. Park ,  Patrick D. McNamara ,  Kwang M. Lee ,  Meng C. Chong ,  Geertjan Joordens ,  Raman S. Thiara ,  Anh T. Hoang ,  John P. Gonzalez

IPC: G01R31/319

CPC classification number: G01R31/31721 ,  G01R19/16552 ,  G01R31/31816 ,  G06F1/28

Abstract: A method and apparatus for power glitch detection in IC's is disclosed. In one embodiment, a method includes a detection circuit in an IC detecting a voltage transient wherein a value of a supply voltage has at least momentarily fallen below a reference voltage value. Responsive thereto, the detection circuit may cause a logic value to be stored in a register indicating that the detection circuit has detected the supply voltage falling below the reference voltage. The IC may include a number of detection circuits coupled to the register, each of which may provide a corresponding indication of detecting the supply voltage falling below the reference voltage. The detection circuits may be placed at different locations, and thus reading the register may yield information indicating the locations where, if any, such voltage transients occurred.

Abstract translation: 公开了一种用于IC中电源故障检测的方法和装置。 在一个实施例中，一种方法包括检测电压瞬变的IC中的检测电路，其中电源电压的值至少暂时低于参考电压值。 响应于此，检测电路可以使逻辑值存储在指示检测电路已经检测到低于参考电压的电源电压的寄存器中。 IC可以包括耦合到寄存器的多个检测电路，每个检测电路可以提供检测低于参考电压的电源电压的相应指示。 检测电路可以放置在不同的位置，因此读取寄存器可以产生指示出现这种电压瞬变的位置（如果有的话）的信息。