公开(公告)号：US20140074421A1

公开(公告)日：2014-03-13

申请号：US13901502

申请日：2013-05-23

Applicant: Apple Inc.

Inventor： Ye YIN ,  Anuj BHATNAGAR ,  Lowell BOONE

IPC: G01D18/00

CPC classification number: G01D18/004 ,  G06F11/2294

Abstract: A system and a method for cloud computing to mitigate instrument variability in a test environment are provided. The system including a test station configured to receive and test a device under test (DUT); a station server configured to provide a data correction algorithm to the memory circuit in the test station; and a data collection server configured to receive test data associated to the DUT in the test station. The data collection server may be further configured to provide a data correction algorithm for the test station to the station server.

Abstract translation: 提供了一种用于云计算的系统和方法，以减轻测试环境中的仪器变异性。 该系统包括被配置为接收和测试被测设备（DUT）的测试台; 站服务器，被配置为向所述测试站中的存储器电路提供数据校正算法; 以及数据收集服务器，被配置为在测试台中接收与DUT相关联的测试数据。 数据收集服务器还可以被配置为向站服务器提供测试站的数据校正算法。