公开(公告)号：US11791908B2

公开(公告)日：2023-10-17

申请号：US17335607

申请日：2021-06-01

Applicant: Apple Inc.

Inventor： Sze Yang Dennis Ng ,  Jr-Yi Shen ,  Harish Rajagopalan

IPC: H04B17/10 ,  H04B7/0408 ,  H01Q15/14

CPC classification number: H04B17/101 ,  H01Q15/14 ,  H04B7/0408

Abstract: A testing system may include a test electronic device having a test antenna disposed in a first signal path of a first antenna array of an electronic device. The test antenna may receive a first signal from the first antenna array. The testing system may also include a reflector disposed in a second signal path of a second antenna array of the electronic device. The reflector may reflect a second signal from the second antenna array to the test antenna. The reflector may include a flat, parabolic, or elliptical curvature that reflects a radio frequency signal emitted by the second antenna array to the test antenna.

公开(公告)号：US20220385378A1

公开(公告)日：2022-12-01

申请号：US17335607

申请日：2021-06-01

Applicant: Apple Inc.

Inventor： Sze Yang Dennis Ng ,  Jr-Yi Shen ,  Harish Rajagopalan

IPC: H04B17/10 ,  H01Q15/14 ,  H04B7/0408

Abstract: A testing system may include a test electronic device having a test antenna disposed in a first signal path of a first antenna array of an electronic device. The test antenna may receive a first signal from the first antenna array. The testing system may also include a reflector disposed in a second signal path of a second antenna array of the electronic device. The reflector may reflect a second signal from the second antenna array to the test antenna. The reflector may include a flat, parabolic, or elliptical curvature that reflects a radio frequency signal emitted by the second antenna array to the test antenna.