公开(公告)号：US20220018651A1

公开(公告)日：2022-01-20

申请号：US17298494

申请日：2019-07-10

Applicant: Applied Materials, Inc.

Inventor： Kamala Chakravarthy RAGHAVAN ,  David Alexander BRITZ

IPC: G01B11/06 ,  G06T7/521 ,  G06T7/73 ,  G06K9/32 ,  G06T3/60 ,  G01B11/25 ,  G06K7/14

Abstract: Embodiments described herein relate to a non-destructive measurement device measurement device and a non-destructive measurement method for determining coating thickness of a three-dimensional (3D) object. In one embodiment, at least one first 3D image of an uncoated surface of the object and at least one second 3D image of a coated surface of the object are collected and analyzed to the determine the coating thickness of the object.

公开(公告)号：US20200064121A1

公开(公告)日：2020-02-27

申请号：US16268446

申请日：2019-02-05

Applicant: Applied Materials, Inc.

Inventor： Kamala Chakravarthy RAGHAVAN ,  David Alexander BRITZ

IPC: G01B11/06 ,  G01B11/25 ,  G06K7/14

Abstract: Embodiments described herein relate to a non-destructive measurement device measurement device and a non-destructive measurement method for determining coating thickness of a three-dimensional (3D) object. In one embodiment, at least one first 3D image of an uncoated surface of the object and at least one second 3D image of a coated surface of the object are collected and analyzed to the determine the coating thickness of the object.