公开(公告)号：US20190392103A1

公开(公告)日：2019-12-26

申请号：US16013937

申请日：2018-06-21

Applicant: Arm Limited

Inventor： Satheesh Balasubramanian ,  Manigandeshwaran Mallikeswaran

IPC: G06F17/50

Abstract: Various implementations described herein are directed to a system and methods for validating data points associated with an integrated circuit. In one implementation, the method may include retrieving data table associated with an integrated circuit, wherein the data table includes characterized electrical data associated with one or more cells of the integrated circuit. Further, the method may include converting the data table to one or more relative matrices. The one or more relative matrices are analyzed to determine a trend formed by entries of the one or more relative matrices. Further, the method may include determining whether one or more entries of the one or more relative matrices deviate from the trend. In response to the determination, the data table is flagged.