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公开(公告)号：US20200182684A1
公开(公告)日：2020-06-11
申请号：US16608563
申请日：2018-04-09
Applicant: Augury Systems Ltd.
Inventor： Saar YOSKOVITZ , Gal SHAUL , Ori NEGRI , Eduard RUDYK , Gal BEN-HAIM
Abstract: A system for continuously monitoring at least one machine including a plurality of magnetic sensors synchronously sensing magnetic fields emitted by at least one machine, the plurality of magnetic sensors sensing the magnetic fields along a corresponding plurality of channels and outputting magnetic field emission signals corresponding to the magnetic fields, a signal analyzer receiving at least a portion of the magnetic field emission signals and performing analysis of the magnetic field emission signals, the signal analyzer providing an output based on the analysis, the output including at least an indication of a condition of the at least one machine and a control module receiving the indication of the condition and initiating at least one of a repair event on the at least one machine, an adjustment to a maintenance schedule of the at least one machine and an adjustment to an operating parameter of the at least one machine based on the indication, whereby efficacy of the at least one machine is improved.
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Patent Agency Ranking
公开(公告)号：US20230080171A1
公开(公告)日：2023-03-16
申请号：US17934395
申请日：2022-09-22
Applicant: Augury Systems Ltd.
Inventor： Saar YOSKOVITZ , Gal SHAUL , Ori NEGRI , Eduard RUDYK , Gal BEN-HAIM
Abstract: A system for continuously monitoring at least one machine including a plurality of magnetic sensors synchronously sensing magnetic fields emitted by at least one machine, the plurality of magnetic sensors sensing the magnetic fields along a corresponding plurality of channels and outputting magnetic field emission signals corresponding to the magnetic fields, a signal analyzer receiving at least a portion of the magnetic field emission signals and performing analysis of the magnetic field emission signals, the signal analyzer providing an output based on the analysis, the output including at least an indication of a condition of the at least one machine and a control module receiving the indication of the condition and initiating at least one of a repair event on the at least one machine, an adjustment to a maintenance schedule of the at least one machine and an adjustment to an operating parameter of the at least one machine based on the indication, whereby efficacy of the at least one machine is improved.
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公开(公告)号：US20200033297A1
公开(公告)日：2020-01-30
申请号：US16337712
申请日：2017-10-03
Applicant: AUGURY SYSTEMS LTD.
Inventor： Eduard RUDYK , Ori NEGRI , Gal SHAUL , Saar YOSKOVITZ
Abstract: A system for monitoring and identifying states of a semiconductor device, the system including at least one acoustic sensor for sensing acoustic emission emitted by at least one semiconductor device operating at a voltage of less than or equal to 220 V, the at least one acoustic sensor outputting at least one acoustic emission signal and a signal processing unit for receiving the at least one acoustic emission signal from the at least one acoustic sensor and for analyzing the at least one acoustic emission signal, the signal processing unit providing an output based on the analyzing, the output being indicative at least of whether the at least one semiconductor device is in an abnormal operating state with respect to a normal operating state of the semiconductor device.
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公开(公告)号：US20240068864A1
公开(公告)日：2024-02-29
申请号：US18504727
申请日：2023-11-08
Applicant: AUGURY SYSTEMS LTD.
Inventor： Saar YOSKOVITZ , Gal SHAUL , Ori NEGRI , Eduard RUDYK , Gal BEN-HAIM
CPC classification number: G01H1/003 , G01H1/04 , G01R33/02 , G05B23/0283
Abstract: A system for continuously monitoring at least one machine including a plurality of magnetic sensors synchronously sensing magnetic fields emitted by at least one machine, the plurality of magnetic sensors sensing the magnetic fields along a corresponding plurality of channels and outputting magnetic field emission signals corresponding to the magnetic fields, a signal analyzer receiving at least a portion of the magnetic field emission signals and performing analysis of the magnetic field emission signals, the signal analyzer providing an output based on the analysis, the output including at least an indication of a condition of the at least one machine and a control module receiving the indication of the condition and initiating at least one of a repair event on the at least one machine, an adjustment to a maintenance schedule of the at least one machine and an adjustment to an operating parameter of the at least one machine based on the indication, whereby efficacy of the at least one machine is improved.
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公开(公告)号：US20230273159A1
公开(公告)日：2023-08-31
申请号：US18312440
申请日：2023-05-04
Applicant: AUGURY SYSTEMS LTD.
Inventor： Eduard RUDYK , Ori NEGRI , Gal SHAUL , Saar YOSKOVITZ
CPC classification number: G01N29/14 , G01H1/00 , G01N29/4427 , G01N29/4436 , G01N2291/2697
Abstract: A system for monitoring and identifying states of a semiconductor device, the system including at least one acoustic sensor for sensing acoustic emission emitted by at least one semiconductor device operating at a voltage of less than or equal to 220 V, the at least one acoustic sensor outputting at least one acoustic emission signal and a signal processing unit for receiving the at least one acoustic emission signal from the at least one acoustic sensor and for analyzing the at least one acoustic emission signal, the signal processing unit providing an output based on the analyzing, the output being indicative at least of whether the at least one semiconductor device is in an abnormal operating state with respect to a normal operating state of the semiconductor device.
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公开(公告)号：US20230076885A1
公开(公告)日：2023-03-09
申请号：US18049166
申请日：2022-10-24
Applicant: AUGURY SYSTEMS LTD.
Inventor： Eduard RUDYK , Ori NEGRI , Gal SHAUL , Saar YOSKOVITZ
Abstract: A system for monitoring and identifying states of a semiconductor device, the system including at least one acoustic sensor for sensing acoustic emission emitted by at least one semiconductor device operating at a voltage of less than or equal to 220 V. the at least one acoustic sensor outputting at least one acoustic emission signal and a signal processing unit for receiving the at least one acoustic emission signal from the at least one acoustic sensor and for analyzing the at least one acoustic emission signal, the signal processing unit providing an output based on the analyzing, the output being indicative at least of whether the at least one semiconductor device is in an abnormal operating state with respect to a normal operating state of the semiconductor device.
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