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公开(公告)号:US20220367334A1
公开(公告)日:2022-11-17
申请号:US17737903
申请日:2022-05-05
发明人: Wen-Hsien HUANG , Kwok Cheung TSANG
IPC分类号: H01L23/498 , H01L23/00 , H01L21/48
摘要: One or more implementations of the subject technology may enable a bond-on-pad (BoP) substrate technology that can eliminate the need to utilize a solder-on-pad (SoP) process. Unlike an SoP process, a BoP Process does not require a solder bump to be formed on a bump pad to attach a joint to a bump pad. The size of an opening on a bump pad for a BoP process may be larger than that of an SoP process. A BoP process may use a solder mask having multiple thicknesses and may be thinner near the bump pads. A BoP process may use a joint having a copper pillar and a solder cap. A BoP process can be used with an underfill or a molding compound technology.