公开(公告)号：US10520393B2

公开(公告)日：2019-12-31

申请号：US15767536

申请日：2017-08-10

Applicant: BAE Systems Information and Electronic Systems Integration Inc.

Inventor： Erik J. Spahr ,  David L. Masters

IPC: G01M11/02

Abstract: The present disclosure relates to a system and method for verifying a diopter setting and range of an optical system eyepiece by utilizing an image sensor to view and analyze test patterns of spots displayed within the optical system eyepiece and calculating the diopter setting and range of the optical system eyepiece from an observed change in the test pattern at different diopter settings.

公开(公告)号：US20190368969A1

公开(公告)日：2019-12-05

申请号：US15767536

申请日：2017-08-10

Applicant: BAE Systems Information and Electronic Systems Integration Inc.

Inventor： Erik J. Spahr ,  David L. Masters

IPC: G01M11/02

Abstract: The present disclosure relates to a system and method for verifying a diopter setting and range of an optical system eyepiece by utilizing an image sensor to view and analyze test patterns of spots displayed within the optical system eyepiece and calculating the diopter setting and range of the optical system eyepiece from an observed change in the test pattern at different diopter settings