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公开(公告)号：US20230206103A1
公开(公告)日：2023-06-29
申请号：US18120348
申请日：2023-03-10
Inventor： Kun WANG
IPC: G06N10/20
CPC classification number: G06N10/20
Abstract: A method is provided which includes: obtaining a set of sequence lengths for performing randomized benchmarking on the quantum computer; performing, for each m, the following operations R times: obtaining m quantum gates that are randomly generated, and quantum gates corresponding to respective inverse operations of the m quantum gates; constructing a quantum circuit, wherein the m quantum gates are sequentially connected in a first order, and the quantum gates corresponding to the respective inverse operations of the m quantum gates are sequentially connected behind the m quantum gates in an order opposite the first order; applying an initial quantum state to the quantum circuit to perform a plurality of standard basis measurements; and determining a number of occurrences of an all-zero sequence; fitting an objective function based on an average expected value corresponding to each m obtained after R operations; and determining an average precision of the quantum computer.
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公开(公告)号：US20230054391A1
公开(公告)日：2023-02-23
申请号：US17980503
申请日：2022-11-03
Inventor： Kun WANG
IPC: G06N10/20
Abstract: A method is provided. The method includes: determining an order of a crosstalk noise of a quantum computer; determining a set of calibration circuits based on the order of the crosstalk noise; preparing a respective standard basis quantum state based on each calibration circuit in the set of calibration circuits, the quantum measurement device is repeatedly run for a predetermined number of times for each standard basis quantum state to measure the standard basis quantum state and to obtain a predetermined number of measurement results ; performing a statistic process on the obtained predetermined number of measurement results corresponding to each standard basis quantum state, to obtain a set of calibration data; determining a global generator based on a hardware topological structure of the quantum computer and the set of calibration data; and constructing a calibration matrix based on the global generator, so as to correct the measurement results of the quantum computer based on the calibration matrix.
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公开(公告)号：US20220327803A1
公开(公告)日：2022-10-13
申请号：US17809210
申请日：2022-06-27
IPC: G06V10/75 , G06V10/40 , G06V10/82 , G06V10/774 , G06V10/80 , G06V10/776 , G06V10/74 , G06V10/22
Abstract: A method of recognizing an object, an electronic device and storage medium are provided, which relate to a field of data processing, in particular to a field of object recognition. The method includes: acquiring a position information and an image data of an object to be detected; performing a feature extraction on the position information and the image data of the object to be detected to obtain a first target concatenating feature; inputting the first target concatenating feature into a pre-trained deep learning model to obtain a second target concatenating feature; determining a second sample concatenating feature matched with the second target concatenating feature by matching the second target concatenating feature with each second sample concatenating feature obtained by processing a first sample concatenating feature of a sample object; and determining the object to be detected as the sample object corresponding to the second sample concatenating feature.
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公开(公告)号：US20230306294A1
公开(公告)日：2023-09-28
申请号：US18202156
申请日：2023-05-25
Inventor： Kun WANG , Shuanghong TANG
IPC: G06N10/20
CPC classification number: G06N10/20
Abstract: A method is provided. The method includes: obtaining a maximally mixed state; repeatedly running a quantum measurement device to perform measurement for a first number of times on the maximally mixed state to obtain first measurement results; applying a phase gate to each quantum bit of the maximal superposition state; performing multiple times of sampling on the phase θ, for each value of θ obtained by sampling, repeatedly running the quantum measurement device to perform measurement for a second number of times on the maximal superposition state to obtain second measurement results; statistically calculating the first measurement result and the second measurement result corresponding to each θ value to obtain a first probability value and a second probability value; and determining the quantum noise intensity of the quantum measurement device based on a difference value between the first probability value and the second probability value.
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